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公开(公告)号:US12007745B2
公开(公告)日:2024-06-11
申请号:US17480165
申请日:2021-09-21
Applicant: ABB Schweiz AG
Inventor: Ido Amihai , Subanatarajan Subbiah , Arzam Muzaffar Kotriwala , Moncef Chioua
IPC: G05B23/02 , G05B19/4065 , G06F18/23213 , G06N3/045
CPC classification number: G05B19/4065 , G05B23/024 , G06F18/23213 , G06N3/045 , G05B2219/37252
Abstract: An apparatus includes an input unit, a processing unit, and an output unit. The input unit is configured to provide the processing unit with sensor data for an item of equipment. The processing unit is configured to implement at least one machine learning algorithm, which has been trained on the basis of a plurality of calibration sensor data for the item of equipment. Training of the at least one machine learning algorithm includes processing the plurality of calibration sensor data to determine at least two clusters representative of different equipment states. The processing unit is configured to implement the at least one machine learning algorithm to process the sensor data to assign the sensor data to a cluster of the at least two clusters to determine an equipment state for the item of equipment. The output unit is configured to output the equipment state for the item of equipment.
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公开(公告)号:US20210011459A1
公开(公告)日:2021-01-14
申请号:US16921957
申请日:2020-07-07
Applicant: ABB Schweiz AG
Inventor: Subanatarajan Subbiah , Benjamin Kloepper
IPC: G05B19/4155 , G06N20/00
Abstract: A method for controlling an industrial process includes: determining, by a process controller, based at least in part on a set of current values and/or past values of state variables of the industrial process, a set of control outputs to be applied to at least one actor and/or lower-level controller configured to cause a performing of at least one physical action on the process; querying, based on at least a subset of the set of current values and/or past values of state variables and on at least a subset of the set of control outputs, a trained machine-learning model configured to output a classification value, and/or a regression value, that is indicative of a propensity of a watching human operator to at least partially override the control outputs delivered by the process controller; and determining that the classification value, the regression value, and/or the propensity, meets a predetermined criterion.
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公开(公告)号:US20210397837A1
公开(公告)日:2021-12-23
申请号:US17465882
申请日:2021-09-03
Applicant: ABB Schweiz AG
Inventor: Subanatarajan Subbiah , Ralf Gitzel , Benedikt Schmidt
Abstract: An apparatus for monitoring a switchgear includes: an input unit; a processing unit; and an output unit. The input unit is provides the processing unit with a monitor infra-red image of a switchgear. The processing unit implements a machine learning classifier algorithm to analyse the monitor infra-red image and determine if there is one or more anomalous hot spots in the switchgear. The machine learning classifier algorithm has been trained based on a plurality of different training images, the plurality of training images including a plurality of synthetic infra-red images generated by an image processing algorithm. The output unit outputs information relating to the one or more anomalous hot spots.
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公开(公告)号:US20210012242A1
公开(公告)日:2021-01-14
申请号:US16921951
申请日:2020-07-07
Applicant: ABB Schweiz AG
Inventor: Subanatarajan Subbiah , Benjamin Kloepper
Abstract: A method for training a machine-learning model to assess at least one condition of industrial equipment, and/or at least one condition of a process running in an industrial plant, based on measurement data gathered by a plurality of sensors, includes: obtaining a plurality of records of measurement data that correspond to a variety of operating situations and a variety of conditions; obtaining, for each record of measurement data, a label that represents a condition in the operating situation characterized by the record of measurement data; and determining a plausibility of at least one record of measurement data, and/or a plausibility of at least one label, based at least in part on a comparison with at least one other record of measurement data, with at least one other label, and/or with additional information about the industrial equipment, and/or about the industrial plant where the industrial equipment resides, and/or about the process.
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公开(公告)号:US12166335B2
公开(公告)日:2024-12-10
申请号:US17467295
申请日:2021-09-06
Applicant: ABB Schweiz AG
Inventor: Ralf Gitzel , Subanatarajan Subbiah , Benedikt Schmidt
IPC: H02B3/00 , G01J5/00 , G06N3/08 , G06N20/00 , G06T7/13 , G06V10/764 , G06V10/774 , G06V20/00 , G06N3/045
Abstract: An apparatus for monitoring a switchgear includes: an input unit; a processing unit; and an output unit. The input unit provides the processing unit with a monitor infra-red image of a switchgear. The processing unit implements a machine learning classifier algorithm to analyse the monitor infra-red image and determine if there is one or more anomalous hot spots in the switchgear. The machine learning classifier algorithm has been trained based on a plurality of different training infra-red images, the plurality of training infra-red images including a plurality of synthetic infra-red images generated from a corresponding plurality of visible images. The output unit outputs information relating to the one or more anomalous hot spots.
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公开(公告)号:US11835429B2
公开(公告)日:2023-12-05
申请号:US17480163
申请日:2021-09-21
Applicant: ABB Schweiz AG
Inventor: Moncef Chioua , Subanatarajan Subbiah , Arzam Muzaffar Kotriwala , Ido Amihai
CPC classification number: G01M99/005
Abstract: An apparatus for equipment monitoring includes an input unit, a processing unit, and an output unit. The input unit is configured to provide the processing unit with batches of temporal sensor data for an item of equipment. Each batch of temporal sensor data includes temporal sensor values as a function of time. The processing unit is configured to process the batches of temporal sensor data to determine batches of spectral sensor data. Each batch of spectral sensor data includes spectral sensor values as a function of frequency. The processing unit is configured to implement at least one statistical process algorithm to process the spectral sensor values for the batches of spectral sensor data to determine index values. For each batch of spectral sensor data there is an index value determined by each of the statistical process algorithms.
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公开(公告)号:US11556111B2
公开(公告)日:2023-01-17
申请号:US16921957
申请日:2020-07-07
Applicant: ABB Schweiz AG
Inventor: Subanatarajan Subbiah , Benjamin Kloepper
IPC: G05B19/4155 , G06N20/00
Abstract: A method for controlling an industrial process includes: determining, by a process controller, based at least in part on a set of current values and/or past values of state variables of the industrial process, a set of control outputs to be applied to at least one actor and/or lower-level controller configured to cause a performing of at least one physical action on the process; querying, based on at least a subset of the set of current values and/or past values of state variables and on at least a subset of the set of control outputs, a trained machine-learning model configured to output a classification value, and/or a regression value, that is indicative of a propensity of a watching human operator to at least partially override the control outputs delivered by the process controller; and determining that the classification value, the regression value, and/or the propensity, meets a predetermined criterion.
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公开(公告)号:US20220004163A1
公开(公告)日:2022-01-06
申请号:US17480165
申请日:2021-09-21
Applicant: ABB Schweiz AG
Inventor: Ido Amihai , Subanatarajan Subbiah , Arzam Muzaffar Kotriwala , Moncef Chioua
IPC: G05B19/4065 , G05B23/02 , G06N3/04 , G06K9/62
Abstract: An apparatus includes an input unit, a processing unit, and an output unit. The input unit is configured to provide the processing unit with sensor data for an item of equipment. The processing unit is configured to implement at least one machine learning algorithm, which has been trained on the basis of a plurality of calibration sensor data for the item of equipment. Training of the at least one machine learning algorithm includes processing the plurality of calibration sensor data to determine at least two clusters representative of different equipment states. The processing unit is configured to implement the at least one machine learning algorithm to process the sensor data to assign the sensor data to a cluster of the at least two clusters to determine an equipment state for the item of equipment. The output unit is configured to output the equipment state for the item of equipment.
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公开(公告)号:US12092526B2
公开(公告)日:2024-09-17
申请号:US17465889
申请日:2021-09-03
Applicant: ABB Schweiz AG
Inventor: Ralf Gitzel , Subanatarajan Subbiah , Benedikt Schmidt
IPC: G01J5/80 , G01J5/00 , G06N3/08 , G06T5/70 , G06V10/143 , G06V10/30 , G06V10/764 , G06V10/82 , H02B13/025 , G06N3/045 , H02B3/00
CPC classification number: G01J5/80 , G01J5/0066 , G01J5/0096 , G06N3/08 , G06T5/70 , G06V10/143 , G06V10/30 , G06V10/764 , G06V10/82 , H02B13/025 , G01J2005/0077 , G06N3/045 , G06T2207/10048 , G06V2201/06 , H02B3/00
Abstract: An apparatus for monitoring a switchgear includes: an input unit; a processing unit; and an output unit. The input unit is provides the processing unit with a monitor infra-red image of the switchgear. The processing unit implements a machine learning classifier algorithm to analyse the monitor infra-red image and determine if there is one or more anomalous hot spots in the switchgear. The machine learning classifier algorithm has been trained based on a plurality of different training infra-red images. The plurality of training infra-red images include a plurality of modified infra-red images generated from a corresponding plurality of infra-red images, each of the modified infra-red images having been modified to remove an effect of obscuration in the image. The output unit outputs information relating to the one or more anomalous hot spots.
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公开(公告)号:US20220236144A2
公开(公告)日:2022-07-28
申请号:US17480163
申请日:2021-09-21
Applicant: ABB Schweiz AG
Inventor: Moncef Chioua , Subanatarajan Subbiah , Arzam Muzaffar Kotriwala , Ido Amihai
IPC: G01M99/00
Abstract: An apparatus for equipment monitoring includes an input unit, a processing unit, and an output unit. The input unit is configured to provide the processing unit with batches of temporal sensor data for an item of equipment. Each batch of temporal sensor data includes temporal sensor values as a function of time. The processing unit is configured to process the batches of temporal sensor data to determine batches of spectral sensor data. Each batch of spectral sensor data includes spectral sensor values as a function of frequency. The processing unit is configured to implement at least one statistical process algorithm to process the spectral sensor values for the batches of spectral sensor data to determine index values. For each batch of spectral sensor data there is an index value determined by each of the statistical process algorithms.
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