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公开(公告)号：US3733483A
公开(公告)日：1973-05-15
申请号：US3733483D
申请日：1971-02-26
Applicant: ASS ELECT IND
CPC classification number: H01J49/484 , H01J49/48
Abstract: An electron spectroscopy apparatus has an analyzer and a retardation lens system. In a first mode of operation, no retardation is applied, and the analyzer scans a low-energy range of the energy spectrum. In a second mode, retardation is applied, and the analyzer scans a high-energy range. The retardation is varied in synchronism with the scanning of the analyzer, so as to maintain a constant retardation factor.
Abstract translation: 电子光谱仪具有分析仪和延迟透镜系统。 在第一种操作模式下，不施加延迟，分析仪扫描能量谱的低能量范围。 在第二模式中，应用延迟，并且分析仪扫描高能量范围。 延迟与分析仪的扫描同步变化，以保持恒定的延迟因子。
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公开(公告)号：US3814936A
公开(公告)日：1974-06-04
申请号：US18625071
申请日：1971-10-04
Applicant: ASS ELECT IND
Inventor： GREEN B
CPC classification number: H01J49/326
Abstract: In a mass spectrometer having a magnetic analyzer, auxiliary ion beam control means comprising electrode structures which behave as electrostatic lenses are located externally of the magnetic analyzer to adjust the focal length of the ion beam to compensate for irregularities in the magnetic field of the magnetic analyzer caused by eddy currents induced in the analyzer during high speed scanning.
Abstract translation: 在具有磁分析仪的质谱仪中，包括作为静电透镜的电极结构的辅助离子束控制装置位于磁分析器的外部，以调整离子束的焦距以补偿磁分析器的磁场中的不规则 在高速扫描期间由分析仪感应的涡流引起的。
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公开(公告)号：US3740551A
公开(公告)日：1973-06-19
申请号：US3740551D
申请日：1970-09-17
Applicant: ASS ELECT IND
Inventor： GREEN B
CPC classification number: H01J49/326
Abstract: A mass spectometer in which plural beams of ions can be generated simultaneously in separate sources. Convergent deflectors bring the beams close together for passage through an analyzer region. A divergent deflector separates an analyzed beam to provide adequate beam spacing for the positioning of detectors to respectively receive the beams.
Abstract translation: 其中可以在单独的源中同时产生多束离子的质谱仪。 会聚偏转器使光束靠近在一起，以通过分析器区域。
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