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公开(公告)号:US20250014960A1
公开(公告)日:2025-01-09
申请号:US18348934
申请日:2023-07-07
Applicant: Apple Inc.
Inventor: Jiongxin LU , Kunzhong Hu , Jun Zhai
IPC: H01L23/31 , H01L21/56 , H01L23/00 , H01L23/498 , H01L25/065
Abstract: Various embodiments of an integrated circuit (IC) die package are disclosed. An IC die package includes an IC die, an interposer structure electrically connected to the IC die, a first bonding structure, a second bonding structure, and a molding compound layer. The first bonding structure includes a first dielectric layer disposed on the IC die and a first conductive plug disposed in the first dielectric layer. The second bonding structure includes a second dielectric layer disposed on the interposer structure and a second conductive plug disposed in the second dielectric layer. The molding compound layer includes a mold region and a mold cavity.
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公开(公告)号:US20250015027A1
公开(公告)日:2025-01-09
申请号:US18348925
申请日:2023-07-07
Applicant: Apple Inc.
Inventor: Jiongxin LU , Kunzhong HU
IPC: H01L23/00 , H01L21/48 , H01L23/498
Abstract: Various embodiments of an integrated circuit (IC) die package are disclosed. An IC die package includes an IC die, an interposer structure electrically connected to the IC die, a first bonding structure, and a second bonding structure. The first bonding structure includes a first dielectric layer disposed on the IC die and also includes a first conductive pad having an embedded portion disposed in the first dielectric layer and an anchor portion extending over a top surface of the first dielectric layer. The second bonding structure includes a second dielectric layer disposed on the interposer structure, a second conductive pad disposed in the second dielectric layer, and an anchor layer surrounding the anchor portion.
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公开(公告)号:US20250112176A1
公开(公告)日:2025-04-03
申请号:US18530291
申请日:2023-12-06
Applicant: Apple Inc.
Inventor: Jiongxin LU , Kunzhong Hu
Abstract: Various embodiments of an integrated circuit (IC) die package are disclosed. An IC die package includes an IC die, an interposer die electrically connected to the IC die, a first bonding structure disposed on the IC die, a second bonding structure bonded to the first bonding structure, a molding compound layer disposed on the second bonding structure and a frame structure disposed on the second bonding structure and surrounding the IC die.
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