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    DISPLAY PANEL AND DISPLAY DEVICE
    2.
    发明申请
    DISPLAY PANEL AND DISPLAY DEVICE 有权

    公开(公告)号：US20220102431A1

    公开(公告)日：2022-03-31

    申请号：US17210733

    申请日：2021-03-24

    Applicant: BOE Technology Group Co., Ltd.

    Inventor： Haitao HUANG ,  Shi Shu ,  Qi Yao ,  Chuanxiang Xu ,  Zhao Cui ,  Lina Jing ,  Renquan Gu ,  Yong Yu

    IPC: H01L27/32 ,  H01L51/52

    Abstract: A display panel is provided with a plurality of sub-pixel areas and includes: a base substrate, a light emitting structure including a plurality of light emitting devices corresponding to the sub-pixel areas, an encapsulating layer, and a pixel defining layer. The pixel defining layer includes: a plurality of openings; at least two sub-pixel defining layers, and a quantum dot color film layer. Each of the sub-pixel defining layers is provided with a pixel separator. The pixel separators fence each of the plurality of openings, and define the plurality of sub-pixel areas. In the at least two sub-pixel defining layers, the sectional shape of the pixel separator in the sub-pixel defining layer which is farthest away from the encapsulating layer includes a regular trapezoid. The quantum dot color film layer includes a plurality of quantum dot color films arranged in the corresponding openings.

    Device and system for testing flatness
    3.
    发明授权
    Device and system for testing flatness 有权

    公开(公告)号：US11948845B2

    公开(公告)日：2024-04-02

    申请号：US17483613

    申请日：2021-09-23

    Applicant: BOE Technology Group Co., Ltd.

    Inventor： Shaodong Sun ,  Haoran Gao ,  Guangcai Yuan ,  Lilei Zhang ,  Wenyue Fu ,  Li Li ,  Hanbo Zheng ,  Shuqi Liu ,  Qi Qi ,  Junwei Yan ,  Pingkuan Gu ,  Lina Jing ,  Yan Chen ,  Yimin Chen

    IPC: G01B11/30 ,  H01L21/66 ,  H01L21/02

    CPC classification number: H01L22/12 ,  G01B11/306 ,  H01L21/02422

    Abstract: The present disclosure relates to a device and a system for testing flatness. The device for testing flatness includes a base, a testing platform, and a ranging sensor. The testing platform is assembled on the base. The testing platform includes a supporting structure. The supporting structure is disposed on the side of the testing platform away from the base and is used to support a to-be-tested board. The structure matches the structure of the to-be-tested board. The ranging sensor is disposed on the side of the testing platform away from the base. After the to-be-tested board is placed on the testing platform, the ranging sensor is used to test distances between a number N of to-be-tested positions on the to-be-tested board and the ranging sensor, to obtain N pieces of distance information, and the N pieces of distance information are used to determine the flatness of the to-be-tested board, where N is an integer greater than 2. According to the embodiments of the present disclosure, the flatness of the glass substrate can be tested to improve the manufacturing process to reduce the flatness of the glass substrate, and avoid the problem that the glass substrate is easily broken when entering the subsequent process equipment and the process equipment is down.

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