Abstract:
A high-voltage device simulation model and a modeling method thereof are provided. The simulation model comprises: a core transistor (101), a drain terminal resistor (102) and a source terminal resistor (103), wherein a first terminal of the drain terminal resistor (102) is electrically connected to a drain (d1) of the core transistor (101) and a second terminal of the drain terminal resistor (102) serves as the drain of the high voltage device; a first terminal of the source terminal resistor (103) is electrically connected to a source (s1) of the core transistor (101) and a second terminal of the source terminal resistor (103) serves as the source of the high voltage device. The relations of the resistance value of the drain terminal resistor (102) are as follows: RD=(RD0/W)*(1+CRD*VDERDD+1/(1+PRWDD*VDERDD))*TFAC_RD, and TFAC_RD=(1+TCRD1*(TEMP−25)+TCRD2*(TEMP−25)*(TEMP−25)).