公开(公告)号：US20230237642A1

公开(公告)日：2023-07-27

申请号：US18009999

申请日：2021-06-10

Applicant: CYBORD LTD.

Inventor： Eyal Isachar Weiss ,  Zeev Efrat

IPC: G06T7/00 ,  G06V10/764 ,  G06T7/73

CPC classification number: G06T7/001 ,  G06V10/764 ,  G06T7/74 ,  G06V2201/06 ,  G06T2207/30141 ,  G06T2207/30148

Abstract: A system and a method for tracing components of an electronic assembly. The method may include obtaining an image of a component of the electronic assembly, generating identification information of the component based on visual features of the component, authenticating the component based on the identification information, generating correlating information by associating the component to an electronic assembly and classifying the component to a group based on the visual features of the component.

公开(公告)号：US20240370590A1

公开(公告)日：2024-11-07

申请号：US18772337

申请日：2024-07-15

Applicant: CYBORD LTD.

Inventor： Eyal Isachar Weiss ,  Zeev Efrat ,  Gil Shimon Givati

IPC: G06F21/73 ,  G01R31/28 ,  G06F21/44 ,  G06N20/00

Abstract: A method for detection of counterfeit and cyber electronic components, comprising: obtaining one or more features from a plurality of electronic components of a first type and from a plurality of electronic components of a second type: processing the one or more features to create a unique model related to an electronic component of the first type and to an electronic component of the second type; examining a detected electronic component by obtaining one or more features of the detected electronic component; executing the unique model with the one or more features of the detected electronic component; determining if the detected electronic component is an authentic electronic component of the first type or the second type; and evaluating the state of the detected electronic component's soldering pads, thereby enabling to detect reworking of a soldering pad of the detected electronic component as an indication of counterfeiting and to evaluate the quality of the pad for solderability.

公开(公告)号：US20250148583A1

公开(公告)日：2025-05-08

申请号：US18862538

申请日：2023-05-04

Applicant: CYBORD LTD.

Inventor： Eyal Isachar Weiss ,  Zeev Efrat

IPC: G06T7/00 ,  G06F40/205 ,  G06F40/30 ,  G06Q10/087 ,  G06V10/82 ,  G06V30/196

Abstract: A system for monitoring for an electronic circuit production line, the system comprising: at least one imaging system operable to acquire an image of a packaging unit (PU) label labeling a PU in which an electronic component that the production line includes in an electronic circuit is packaged by a supplier for delivery to an enterprise that operates the production line, and during production of the circuit at least one image of the component; and a processing and data hub having software configured to process the images to: determine a PU data record having logistical data fields comprising logistical data characterizing the PU and the component packaged in the PU; determine an encapsulation data record having logistical data fields comprising logistical data characterizing an encapsulation package of the component; and store the PU and encapsulation data records in a memory.

公开(公告)号：US12105857B2

公开(公告)日：2024-10-01

申请号：US17599603

申请日：2020-04-01

Applicant: CYBORD LTD.

Inventor： Eyal Isachar Weiss ,  Zeev Efrat ,  Gil Shimon Givati

IPC: H04L29/06 ,  G01R31/28 ,  G06F21/44 ,  G06F21/73 ,  G06N20/00

CPC classification number: G06F21/73 ,  G01R31/2853 ,  G01R31/2894 ,  G06F21/44 ,  G06N20/00

Abstract: Embodiments of the present invention may include a method and a system for detection of counterfeit and cyber electronic components by obtaining one or more features from a plurality of electronic components of a first type and from a plurality of N electronic components of a second type, processing the one or more features to create a unique model related to an electronic component of the first type and to an electronic component of the second type, examining a detected electronic component by obtaining one or more features of the detected electronic component, executing the unique model with the one or more features of the detected electronic component and determining if the detected electronic component is an authentic electronic component of the first type or the second type.