公开(公告)号：US20210242865A1

公开(公告)日：2021-08-05

申请号：US17159786

申请日：2021-01-27

Applicant: Cirrus Logic International Semiconductor Ltd.

Inventor： Andrew BUIST ,  Mark MCCLOY-STEVENS ,  Dave SMITH ,  Gordon RUSSELL ,  Huy Binh LE

IPC: H03K17/0814 ,  H02H3/18

Abstract: Circuitry for controlling current between a load and a power supply, the circuitry comprising: an output stage comprising: an input node configured to be coupled to the power supply; and an output node configured to be coupled to the load; and one or more control nodes for controlling a conduction path between the input node and the output node; and protection circuitry coupled to the one or more control nodes, the protection circuitry configured to break the conduction path between the input node and the output node when a load voltage at the output node exceeds a supply voltage at the input node, wherein the protection circuitry comprises: an active protection circuit configured to break the conduction path when the supply voltage exceeds an operational threshold of the active protection circuit; and a passive protection circuit configured to break the conduction path when the supply voltage is below an operation threshold of the active protection circuit.

公开(公告)号：US20210148968A1

公开(公告)日：2021-05-20

申请号：US17065799

申请日：2020-10-08

Applicant: Cirrus Logic International Semiconductor Ltd.

Inventor： James WELLS ,  Saurabh SINGH ,  Huy Binh LE ,  Gavin WILSON ,  Niall MCGURNAGHAN ,  Simon R. FOSTER ,  Mark MCCLOY-STEVENS

IPC: G01R31/28 ,  G01R31/56

Abstract: The present disclosure relates to self-test circuitry for a system that includes one or more current control subsystems, each current control subsystem having a load terminal for coupling the current control subsystem to a load. The self-test circuitry comprises: a signal path associated with each current control subsystem, each signal path configured to selectively couple a measurement node to the load terminal of the current control subsystem, wherein the measurement node is common to all of the signal paths; voltage detection circuitry; and test voltage source circuitry configured to provide a test voltage to the measurement node. The voltage detection circuitry is operable to output a signal indicative of a fault condition if a voltage detected at the measurement node differs from the test voltage when the measurement node is coupled to the load terminal.