公开(公告)号：US20220307872A1

公开(公告)日：2022-09-29

申请号：US17211073

申请日：2021-03-24

Applicant: Cirrus Logic International Semiconductor Ltd.

Inventor： Siddharth MARU ,  Josh SANZ-ROBINSON ,  Tejasvi DAS ,  John L. MELANSON

IPC: G01D18/00 ,  G01D5/20

Abstract: A system may include a plurality of sensors configured to sense a physical quantity and a calibration subsystem configured to perform a calibration comprising: comparing a measured characteristic from each of at least two sensors of the plurality of sensors to determine a sensitivity drift of at least one sensor of the plurality of sensors; based on the measured characteristics of the at least two sensors and stored reference characteristics for the at least two sensors, calculating a normalization factor; and applying the normalization factor to the measured characteristic of the at least one sensor to ensure sensitivity of the plurality of sensors relative to each other remains approximately constant.

公开(公告)号：US20220155900A1

公开(公告)日：2022-05-19

申请号：US17097384

申请日：2020-11-13

Applicant: Cirrus Logic International Semiconductor Ltd.

Inventor： Josh SANZ-ROBINSON ,  Siddharth MARU ,  Tejasvi DAS

IPC: G06F3/041 ,  G06F3/02

Abstract: A correction unit for use in a sensor system, the sensor system comprising a force sensor configured to output a sensor signal indicative of a temporary mechanical distortion of a material under an applied force, the correction unit configured, based on the sensor signal, to: estimate an effect of the applied force on how the material will return towards an undistorted form upon a substantial reduction or removal of the applied force; and generate a corrected signal based on the estimation.

公开(公告)号：US20220196498A1

公开(公告)日：2022-06-23

申请号：US17128859

申请日：2020-12-21

Applicant: Cirrus Logic International Semiconductor Ltd.

Inventor： Eric LINDEMANN ,  Josh SANZ-ROBINSON ,  Pablo PESO PARADA

IPC: G01L5/00 ,  G01L5/10

Abstract: A classifier for classifying sensor samples in a sensor system, the sensor system comprising N force sensors each configured to output a sensor signal, where N>1, each sensor sample comprising N sample values from the N sensor signals, respectively, defining a sample vector in N-dimensional vector space, the classifier having access to a target definition corresponding to a target event, the target definition defining a bounded target region of X-dimensional vector space, where X≤N, the classifier configured, for a candidate sensor sample, to perform a classification operation comprising: determining a candidate location in the X-dimensional vector space defined by a candidate vector corresponding to the candidate sensor sample, the candidate vector being the sample vector for the candidate sensor sample or a vector derived therefrom; and generating a classification result for the candidate sensor sample based on the candidate location, the classification result labelling the candidate sensor sample as indicative of the target event if the candidate location is within the target region.

公开(公告)号：US20230043516A1

公开(公告)日：2023-02-09

申请号：US17968565

申请日：2022-10-18

Applicant: Cirrus Logic International Semiconductor Ltd.

Inventor： Josh SANZ-ROBINSON ,  Siddharth MARU ,  Tejasvi DAS

IPC: G06F3/041 ,  G06F3/02 ,  G06F3/01

Abstract: A correction unit for use in a sensor system, the sensor system comprising a force sensor configured to output a sensor signal indicative of a temporary mechanical distortion of a material under an applied force, the correction unit configured, based on the sensor signal, to: estimate an effect of the applied force on how the material will return towards an undistorted form upon a substantial reduction or removal of the applied force; and generate a corrected signal based on the estimation.

公开(公告)号：US20220198227A1

公开(公告)日：2022-06-23

申请号：US17212880

申请日：2021-03-25

Applicant: Cirrus Logic International Semiconductor Ltd.

Inventor： Josh SANZ-ROBINSON ,  Siddharth MARU ,  Rahul GAWDE ,  Jon D. HENDRIX ,  Eric LINDEMANN ,  Pablo PESO PARADA

IPC: G06K9/62 ,  G01L1/14 ,  H03K17/96

Abstract: A classification system for classifying sensor samples in a sensor system, the sensor system comprising N force sensors each configured to output a sensor signal, where N≥1, each sensor sample comprising N sample values from the N sensor signals, respectively, the classification system comprising: a classifier configured, for each of a series of candidate sensor samples, to perform a classification operation based on the N sample values concerned and generate a classification result which labels the candidate sensor sample as indicative of a defined target event, thereby generating a series of classification results corresponding to the series of candidate sensor samples, respectively; a determiner configured to output at least one event determination based on the series of classification results; and a controller configured to control the classifier and/or the determiner based on one or more controller input signals.