公开(公告)号：US11907793B2

公开(公告)日：2024-02-20

申请号：US16958547

申请日：2018-12-20

Applicant: Datalogic IP Tech S.R.L.

Inventor： Rinaldo Zocca ,  Lorenzo Bassi ,  Clemente Iannone

IPC: G06K5/00 ,  G06K5/04 ,  G06F17/18 ,  G06Q10/0639 ,  G06Q10/0875 ,  G06Q10/10 ,  G06Q50/04 ,  G06T7/00 ,  G07C3/14 ,  G06K7/14 ,  G06K7/10

CPC classification number: G06K5/04 ,  G06F17/18 ,  G06K5/00 ,  G06Q10/06395 ,  G06Q10/0875 ,  G06Q10/10 ,  G06Q50/04 ,  G06T7/0004 ,  G07C3/143 ,  G06K7/1413 ,  G06K7/1417 ,  G06K2007/10524 ,  G06T2207/30204

Abstract: A computer-implemented system and process of producing a metric quality grade profile for use during inspection of DPM symbol marked on parts may include storing average metrics measured in a controlled environment for a “golden” sample. Measurements of the DPM symbol of the “golden” sample may be performed. Measurements of the metrics of the “golden” sample in an uncontrolled environment may be performed. Average metrics from the uncontrolled environment may be calculated. The averaged metrics from the controlled and uncontrolled environment may be compared. The user may be enabled to set an acceptable grade for the individual metrics. The acceptable grades for the individual metrics as a profile of the DPM symbol in memory.

公开(公告)号：US11679451B2

公开(公告)日：2023-06-20

申请号：US16965954

申请日：2019-01-28

Applicant: Datalogic IP Tech S.R.L.

Inventor： Lorenzo Bassi

IPC: B41J2/44 ,  B41J2/47 ,  B41J2/475 ,  B41M5/24 ,  B41M5/26 ,  B23K26/03 ,  B23K26/082 ,  B23K26/364 ,  B23K26/359

CPC classification number: B23K26/364 ,  B23K26/082 ,  B23K26/359 ,  B41J2/442 ,  B41J2/47 ,  B41J2/475 ,  B41M5/24 ,  B41M5/262 ,  B41M5/267

Abstract: A system and method for performing laser marking may include identifying an event performed by a laser marking system. A laser marking unit may be driven to mark the feature on the part. The part may be illuminated with a visible illumination signal to indicate an occurrence of the event in response to identifying the event.

公开(公告)号：US20210065093A1

公开(公告)日：2021-03-04

申请号：US16958547

申请日：2018-12-20

Applicant: Datalogic IP Tech S.R.L.

Inventor： Rinaldo Zocca ,  Lorenzo Bassi ,  Clemente Iannone

IPC: G06Q10/06 ,  G06Q10/08 ,  G06Q10/10 ,  G07C3/14 ,  G06Q50/04 ,  G06F17/18 ,  G06T7/00

Abstract: A computer-implemented system and process of producing a metric quality grade profile for use during inspection of DPM symbol marked on parts may include storing average metrics measured in a controlled environment for a “golden” sample. Measurements of the DPM symbol of the “golden” sample may be performed. Measurements of the metrics of the “golden” sample in an uncontrolled environment may be performed. Average metrics from the uncontrolled environment may be calculated. The averaged metrics from the controlled and uncontrolled environment may be compared. The user may be enabled to set an acceptable grade for the individual metrics. The acceptable grades for the individual metrics as a profile of the DPM symbol in memory.