公开(公告)号：US07692138B1

公开(公告)日：2010-04-06

申请号：US11975548

申请日：2007-10-19

Applicant: David James Ray ,  Nicholas Gregory Doe ,  Terence Rogers Lundy

Inventor： David James Ray ,  Nicholas Gregory Doe ,  Terence Rogers Lundy

IPC: G01B5/28

CPC classification number: G01Q60/22 ,  G01Q30/025 ,  G02B21/0024

Abstract: A combination confocal and scanning probe microscope system permits accurate location of a sample within the field of view as the sample translates from one type of microscope to the other. Alternate embodiments permit both microscopes to view the same sample location at the same time. Further alternate embodiments include a confocal and a probe microscope integrated into a common optical path.

Abstract translation: 组合共焦和扫描探针显微镜系统允许样品在视野内准确定位，因为样品从一种显微镜转换到另一种显微镜。 替代实施例允许两个显微镜同时观察相同的样品位置。 另外的替代实施例包括集成到公共光路中的共焦和探针显微镜。

公开(公告)号：US06748794B2

公开(公告)日：2004-06-15

申请号：US10190404

申请日：2002-07-07

Applicant: David James Ray

Inventor： David James Ray

IPC: G01B528

CPC classification number: G01Q20/02 ,  G01Q70/02 ,  Y10S977/868 ,  Y10S977/87

Abstract: A scanning force microscope system that employs a laser (76) and a probe assembly (24) mounted in a removable probe illuminator assembly (22), that is mounted to the moving portion of a scanning mechanism. The probe illuminator assembly may be removed from the microscope to permit alignment of said laser beam onto a cantilever (30) after removal. This prevents damage to, and shortens alignment time of, the microscope during replacement and alignment of the probe assembly. The scanning probe microscope assembly (240) supports a scanning probe microscope (244). Scanning probe microscope (244) holds a removable probe sensor assembly (242). Removable probe sensor assembly (242) may be transported and conveniently attached to the adjustment station (250) where the probe sensor assembly parameters may be observed and adjusted if necessary. The probe sensor assembly (242) may then be attached to the scanning probe microscope (244).

Abstract translation: 一种扫描力显微镜系统，其使用安装在扫描机构的移动部分上的安装在可移除的探针照射器组件（22）中的激光器（76）和探针组件（24）。 探针照明器组件可以从显微镜移除，以允许在去除之后将所述激光束对准到悬臂（30）上。 这可以防止在更换和对准探头组件期间显微镜的损坏和缩短对准时间。 扫描探针显微镜组件（240）支撑扫描探针显微镜（244）。 扫描探针显微镜（244）保持可移除的探针传感器组件（242）。 可移动的探针传感器组件（242）可以被传送并方便地附接到调节站（250），其中如果需要可以观察和调整探针传感器组件的参数。 探头传感器组件（242）然后可以附接到扫描探针显微镜（244）。