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1.发明申请公开(公告)号：US20180254840A1
公开(公告)日：2018-09-06
申请号：US15967051
申请日：2018-04-30
Applicant: ETS-Lindgren Inc.
Inventor： Michael David FOEGELLE
IPC: H04B17/13 , H04B17/391 , H04W52/52 , H04W24/06
CPC classification number: H04B17/13 , H04B17/3912 , H04W24/06 , H04W52/52
Abstract: Some embodiments include a system for simulating electromagnetic environments that includes a channel emulator having a plurality of outputs, each output associated with a different operational path. Each operational path has a power amplifier, an antenna and a first coupling mechanism. The power amplifier is coupled to an output of the channel emulator. The antenna is in communication with a test region of the apparatus. The first coupling mechanism simultaneously couples power to the antenna and to a first measurement path when the operational path is coupled to the test region, so that a calibration state of the operational path can be determined and adjusted without interruption of a signal coupled to the antenna in the operational path.
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公开(公告)号：US20180287721A1
公开(公告)日：2018-10-04
申请号：US15892042
申请日：2018-02-08
Applicant: ETS-Lindgren Inc.
Inventor： Jari VIKSTEDT , Michael David FOEGELLE
CPC classification number: H04B17/16 , G01R29/0814 , G01R29/0871 , G01R29/0878 , G01R29/105 , H04B7/0617 , H04B17/0085 , H04W24/06
Abstract: In some embodiments, a positioning system is configured to position a plurality of antennas about a device under test (DUT). According to one embodiment, a positioning system includes a first positioner configured to hold a DUT and to provide motion of the DUT about a first axis, and a second positioner configured to hold a first antenna and to provide motion of the first antenna about a second axis.
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公开(公告)号：US20180034560A1
公开(公告)日：2018-02-01
申请号：US15221959
申请日：2016-07-28
Applicant: ETS-Lindgren Inc.
Inventor： Michael David FOEGELLE
IPC: H04B17/00 , H04W24/06 , H04W72/04 , H04B17/364
CPC classification number: H04B17/0087 , H04B17/0085 , H04B17/364 , H04B2001/0408 , H04W24/06 , H04W72/042
Abstract: A method and system for measuring a device under test are disclosed. In some embodiments, an electromagnetic measurement system to test a device under test, DUT is provided. The system includes, at a central location, an emulator core configured to introduce an impairment in each of at least one transmit signal to produce a digital impaired signal; and at a remote location, a transmitter configured to convert the digital impaired signal to an analog RF signal.
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公开(公告)号：US20190230595A1
公开(公告)日：2019-07-25
申请号：US16288672
申请日：2019-02-28
Applicant: ETS-Lindgren Inc.
Inventor： Michael David FOEGELLE
IPC: H04W52/04 , H04B17/29 , H04B17/13 , H04B17/391
CPC classification number: H04W52/04 , H04B17/13 , H04B17/29 , H04B17/3912
Abstract: Methods, tests systems and computers for controlling power delivered to a test volume are provided. According to one aspect, an electromagnetic test system has at least one operational path having a channel emulator output, an amplifier, an attenuator and an antenna. A method includes, for a given desired output power level, C, setting a channel emulator output power to a power level B, and setting the attenuator to a setting A, such that C is a function of B and A. In such embodiments, the attenuation A may be calculated based on an upper limit output power of the channel emulator and the desired output power C.
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公开(公告)号：US20170322164A1
公开(公告)日：2017-11-09
申请号：US15656703
申请日：2017-07-21
Applicant: ETS-Lindgren Inc.
Inventor： Bryan Howard SAYLER , Michael David FOEGELLE , Garth Anthony D'ABREU
CPC classification number: G01N21/8806 , G01N21/474 , G01N29/00 , G01N2021/8812 , G01N2201/0631 , G01R29/0821 , Y10T29/49716
Abstract: A method and system for selectively varying the performance of a test chamber are disclosed. According to one aspect, the performance is affected by a variable absorbing structure of the test chamber. The absorbing structure enables selective exposure of absorbing material to achieve a specific performance.
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Patent Agency Ranking
公开(公告)号：US20140338471A1
公开(公告)日：2014-11-20
申请号：US14278712
申请日：2014-05-15
Applicant: ETS-Lindgren Inc.
Inventor： Bryan Howard SAYLER , Michael David FOEGELLE , Garth Anthony D'ABREU
IPC: G01M99/00
CPC classification number: G01N21/8806 , G01N21/474 , G01N29/00 , G01N2021/8812 , G01N2201/0631 , G01R29/0821 , Y10T29/49716
Abstract: A method and system for selectively varying the performance of a test chamber are disclosed. According to one aspect, the performance is affected by a variable absorbing structure of the test chamber. The absorbing structure enables selective exposure of absorbing material to achieve a specific performance.
Abstract translation: 公开了一种用于选择性地改变测试室性能的方法和系统。 根据一个方面，性能受到测试室的可变吸收结构的影响。 吸收结构使得能够选择性地暴露吸收材料以实现特定的性能。
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公开(公告)号：US20190273566A1
公开(公告)日：2019-09-05
申请号：US16414231
申请日：2019-05-16
Applicant: ETS-Lindgren Inc.
Inventor： Jari VIKSTEDT , Michael David FOEGELLE
Abstract: In some embodiments, a positioning system is configured to position a plurality of antennas about a device under test (DUT). According to one embodiment, a positioning system includes a first positioner configured to hold a DUT and to provide motion of the DUT about a first axis, and a second positioner configured to hold a first antenna and to provide motion of the first antenna about a second axis.
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公开(公告)号：US20180034563A1
公开(公告)日：2018-02-01
申请号：US15222018
申请日：2016-07-28
Applicant: ETS-Lindgren Inc.
Inventor： Michael David FOEGELLE
IPC: H04B17/00 , H04B17/364 , H04W24/06 , H04W72/04
CPC classification number: H04B17/0087 , H04B17/0085 , H04B17/364 , H04B2001/0408 , H04W24/06 , H04W72/042
Abstract: In some embodiments, an electromagnetic measurement system to perform radio frequency, RF, downlink testing of a device under test, DUT, in a chamber is provided. Exterior to the chamber is an emulator core configured to introduce an impairment in each of at least one transmit signal to produce at least one impaired signal for each of at least one emulated channel. Within the chamber, for each of the at least one emulated channel, an up-converter is configured to up-convert an impaired signal of the emulated channel to produce a radio frequency, RF, signal.
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公开(公告)号：US20180034561A1
公开(公告)日：2018-02-01
申请号：US15221981
申请日：2016-07-28
Applicant: ETS-Lindgren Inc.
Inventor： Michael David FOEGELLE
CPC classification number: H04B17/0087 , H04B1/0028 , H04B17/0085
Abstract: A method and system for measuring a device under test are disclosed. Some embodiments include a distributed channel emulation system implementing a downlink channel, including at a central location, an emulator core configured to introduce an impairment in each of at least one transmit signal to produce at least one impaired signal for each of at least one emulated channel. The system includes, at a remote location, for each of at the least one emulated channel, an up-converter configured to up-convert an impaired signal of the emulated channel to produce a radio frequency, RF, signal.
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公开(公告)号：US20180034559A1
公开(公告)日：2018-02-01
申请号：US15221944
申请日：2016-07-28
Applicant: ETS-Lindgren Inc.
Inventor： Michael David FOEGELLE
IPC: H04B17/00 , H04W24/06 , H04W72/04 , H04B17/364
CPC classification number: H04B17/0087 , H04B17/0085 , H04B17/29 , H04B17/364 , H04B2001/0408 , H04W24/06 , H04W72/042
Abstract: A method and system for measuring a device under test are disclosed. In some embodiments, a method of implementing a measurement system is provided. The method includes providing a plurality of nodes, each node including a combination of a communication tester configured to generate a communication signal and a channel emulator configured to emulate a channel, and providing a user interface configured to enable a user to control at least one of the plurality of nodes.
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