ELECTRON DIFFRACTION SYSTEM FOR CHARACTERIZING NANOCRYSTALLINE STRUCTURES

    公开(公告)号:US20240255447A1

    公开(公告)日:2024-08-01

    申请号:US18429073

    申请日:2024-01-31

    CPC classification number: G01N23/20058 G01N23/20008

    Abstract: One variation of a system includes: a housing configured to hold a vacuum; a primary assembly; and a cooling assembly. The primary assembly includes: a sample receiver including a base section and a sample holder mounted to the base section and configured to transiently receive and retain a sample specimen; a receiver platform configured to receive and support the sample receiver; and a set of positioner stages flexibly coupled to the receiver platform and configured to transiently drive the sample holder to locate the sample specimen in a position intersecting an electron pathway. The cooling assembly includes: a cold finger defining an end submerged in a volume of coolant; and a conductive cooling braid coupled to the cold finger and to the primary assembly; and configured to communicate heat from the primary assembly into the cold finger to cool the sample specimen to temperatures within a target sample temperature range.

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