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公开(公告)号：US20220409184A1
公开(公告)日：2022-12-29
申请号：US17356262
申请日：2021-06-23
Applicant: Exo Imaging, Inc.
Inventor： Jonathan STRODE , Rajeev SIVADASAN , Gordon SASAMORI
Abstract: Described herein are methods and systems for testing transducers and associated integrated circuits. In some cases, a method or system described herein can comprise modulating a bias voltage using a test signal in order to produce a modulated bias voltage signal useful in testing a plurality of transducers of a transducer array in parallel.
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