公开(公告)号：US12053330B2

公开(公告)日：2024-08-06

申请号：US17356262

申请日：2021-06-23

Applicant: Exo Imaging, Inc.

Inventor： Jonathan Strode ,  Rajeev Sivadasan ,  Gordon Sasamori

IPC: A61B8/00 ,  B06B1/02 ,  B06B1/06 ,  G01S15/89

CPC classification number: A61B8/58 ,  B06B1/0207 ,  B06B1/0292 ,  B06B1/0622 ,  G01S15/8915 ,  B06B2201/40 ,  B06B2201/51 ,  B06B2201/55 ,  B06B2201/76

Abstract: Described herein are methods and systems for testing transducers and associated integrated circuits. In some cases, a method or system described herein can comprise modulating a bias voltage using a test signal in order to produce a modulated bias voltage signal useful in testing a plurality of transducers of a transducer array in parallel.

公开(公告)号：US20240385142A1

公开(公告)日：2024-11-21

申请号：US18319706

申请日：2023-05-18

Applicant: Exo Imaging, Inc.

Inventor： Mohammad Afrough ,  Rajeev Sivadasan ,  Jed Davidow ,  Gordon T. Sasamori

IPC: G01N29/06 ,  G01N29/04

Abstract: A visualization of electrical continuity test results for a transducer tile array may be generated according to embodiments herein. The visualization may include an indication, for each channel under test, of whether the channel passed or failed the continuity test, and an indication of whether the transducer tile array is determined to be functional.