DEFECT DETECTION AND IMAGE COMPARISON OF COMPONENTS IN AN ASSEMBLY

    公开(公告)号:US20230162495A1

    公开(公告)日:2023-05-25

    申请号:US18151386

    申请日:2023-01-06

    Abstract: A method is disclosed that includes receiving, by a processing device, a plurality of images of a test assembly. The processing device selects a component in the test assembly and an image of the plurality of images of the test assembly as received. For the component as selected and the image as selected, the processing device compares a plurality of portions of the image as selected to a corresponding plurality of portions of a corresponding profile image and computing a matching score for each of the plurality of portions. The processing device selects a largest matching score from the matching score for each of the plurality of portions as a first matching score for the component as selected and the image as selected. The first matching score is stored for the component as selected and the image as selected.

    DEFECT DETECTION AND IMAGE COMPARISON OF COMPONENTS IN AN ASSEMBLY

    公开(公告)号:US20210366094A1

    公开(公告)日:2021-11-25

    申请号:US16882203

    申请日:2020-05-22

    Abstract: A method is disclosed that includes receiving, by a processing device, a plurality of images of a test assembly. The processing device selects a component in the test assembly and an image of the plurality of images of the test assembly as received. For the component as selected and the image as selected, the processing device compares a plurality of portions of the image as selected to a corresponding plurality of portions of a corresponding profile image and computing a matching score for each of the plurality of portions. The processing device selects a largest matching score from the matching score for each of the plurality of portions as a first matching score for the component as selected and the image as selected. The first matching score is stored for the component as selected and the image as selected.

    DEFECT DETECTION OF A COMPONENT IN AN ASSEMBLY

    公开(公告)号:US20210366093A1

    公开(公告)日:2021-11-25

    申请号:US16882198

    申请日:2020-05-22

    Abstract: A system for validating installation correctness of a component in a test assembly includes a housing having a platform including a tiered surface. The tiered surface forms an abutment surface configured as a stop against which a test assembly is abutted. A plurality of cameras is positioned to capture different views of the test assembly. A processing device is configured to execute instructions to capture an image from each of the plurality of cameras of the test assembly that includes a plurality of components. Each of the plurality of components is analyzed within each image of the plurality of images. A matching score is determined and an indication of whether the plurality of components was correctly installed in the test assembly is generated.

    DEFECT DETECTION OF A COMPONENT IN AN ASSEMBLY

    公开(公告)号:US20240420315A1

    公开(公告)日:2024-12-19

    申请号:US18820093

    申请日:2024-08-29

    Abstract: A system for validating installation correctness of a component in a test assembly includes a housing having a platform including a tiered surface. The tiered surface forms an abutment surface configured as a stop against which a test assembly is abutted. A plurality of cameras is positioned to capture different views of the test assembly. A processing device is configured to execute instructions to capture an image from each of the plurality of cameras of the test assembly that includes a plurality of components. Each of the plurality of components is analyzed within each image of the plurality of images. A matching score is determined and an indication of whether the plurality of components was correctly installed in the test assembly is generated.

    Defect detection and image comparison of components in an assembly

    公开(公告)号:US11900666B2

    公开(公告)日:2024-02-13

    申请号:US18151386

    申请日:2023-01-06

    Abstract: A method is disclosed that includes receiving, by a processing device, a plurality of images of a test assembly. The processing device selects a component in the test assembly and an image of the plurality of images of the test assembly as received. For the component as selected and the image as selected, the processing device compares a plurality of portions of the image as selected to a corresponding plurality of portions of a corresponding profile image and computing a matching score for each of the plurality of portions. The processing device selects a largest matching score from the matching score for each of the plurality of portions as a first matching score for the component as selected and the image as selected. The first matching score is stored for the component as selected and the image as selected.

    Defect detection and image comparison of components in an assembly

    公开(公告)号:US11551349B2

    公开(公告)日:2023-01-10

    申请号:US16882203

    申请日:2020-05-22

    Abstract: A method is disclosed that includes receiving, by a processing device, a plurality of images of a test assembly. The processing device selects a component in the test assembly and an image of the plurality of images of the test assembly as received. For the component as selected and the image as selected, the processing device compares a plurality of portions of the image as selected to a corresponding plurality of portions of a corresponding profile image and computing a matching score for each of the plurality of portions. The processing device selects a largest matching score from the matching score for each of the plurality of portions as a first matching score for the component as selected and the image as selected. The first matching score is stored for the component as selected and the image as selected.

    COSMETIC INSPECTION SYSTEM
    9.
    发明申请

    公开(公告)号:US20220092763A1

    公开(公告)日:2022-03-24

    申请号:US17028238

    申请日:2020-09-22

    Abstract: A system for cosmetic inspection of a test object is disclosed that includes a movable platform for receiving a test object. The movable platform is capable of positioning the test object within a dome. A plurality of cameras arranged oriented to capture different views of a plurality of surfaces of the test object. A plurality lights arranged are outside the dome, the plurality of lights selectively enabled or disabled according to which of the plurality of surfaces of the test object is to be captured.

    DEFECT DETECTION AND IMAGE COMPARISON OF COMPONENTS IN AN ASSEMBLY

    公开(公告)号:US20240185594A1

    公开(公告)日:2024-06-06

    申请号:US18438811

    申请日:2024-02-12

    Abstract: A method is disclosed that includes receiving, by a processing device, a plurality of images of a test assembly. The processing device selects a component in the test assembly and an image of the plurality of images of the test assembly as received. For the component as selected and the image as selected, the processing device compares a plurality of portions of the image as selected to a corresponding plurality of portions of a corresponding profile image and computing a matching score for each of the plurality of portions. The processing device selects a largest matching score from the matching score for each of the plurality of portions as a first matching score for the component as selected and the image as selected. The first matching score is stored for the component as selected and the image as selected.

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