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公开(公告)号：US20210014998A1
公开(公告)日：2021-01-14
申请号：US16860631
申请日：2020-04-28
Applicant: Hewlett Packard Enterprise Development LP
Inventor： Vinay Sahadevappa Banakar , Pavan Belur Gopalakrishna Upadhya , Maneesh Keshavan Bendiganavale
Abstract: In some examples, a method includes: determining workload constraints for placement of information technology (IT) equipment within a data center; determining physical constraints for placement of the IT equipment; inferring hardware placement capabilities of IT equipment racks within the data center; and generating a ranked list of locations for IT equipment placement within the data center based on the determined workload constraints, determined physical constraints, and inferred hardware placement capabilities.
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公开(公告)号：US11696418B2
公开(公告)日：2023-07-04
申请号：US16860631
申请日：2020-04-28
Applicant: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
Inventor： Vinay Sahadevappa Banakar , Pavan Belur Gopalakrishna Upadhya , Maneesh Keshavan Bendiganavale
CPC classification number: H05K7/1498 , G06N5/04 , G06Q10/06 , H05K7/18 , H05K7/20836
Abstract: In some examples, a method includes: determining workload constraints for placement of information technology (IT) equipment within a data center; determining physical constraints for placement of the IT equipment; inferring hardware placement capabilities of IT equipment racks within the data center; and generating a ranked list of locations for IT equipment placement within the data center based on the determined workload constraints, determined physical constraints, and inferred hardware placement capabilities.
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Patent Agency Ranking
公开(公告)号：US11314573B2
公开(公告)日：2022-04-26
申请号：US16206989
申请日：2018-11-30
Applicant: Hewlett Packard Enterprise Development LP
Inventor： Naveena Kedlaya , Maneesh Keshavan Bendiganavale
IPC: G06F11/07 , H04L41/0631
Abstract: In an example, a first number of events associated with a first event type that are received in the first time window is compared against a first threshold. The first event type is one of a plurality of event types, and each event type corresponds to an amount of resource consumed by an event associated with the event type. It is detected whether events associated with the first event type received in the first time window are part of an event storm based on the first number of events and the first threshold.
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公开(公告)号：US20200174868A1
公开(公告)日：2020-06-04
申请号：US16206989
申请日：2018-11-30
Applicant: Hewlett Packard Enterprise Development LP
Inventor： Naveena Kedlaya , Maneesh Keshavan Bendiganavale
IPC: G06F11/07
Abstract: In an example, a first number of events associated with a first event type that are received in the first time window is compared against a first threshold. The first event type is one of a plurality of event types, and each event type corresponds to an amount of resource consumed by an event associated with the event type. It is detected whether events associated with the first event type received in the first time window are part of an event storm based on the first number of events and the first threshold.
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公开(公告)号：US10938623B2
公开(公告)日：2021-03-02
申请号：US16168821
申请日：2018-10-23
Applicant: Hewlett Packard Enterprise Development LP
Inventor： Pavan Belur Gopalakrishna Upadhya , Vinay Sahadevappa Banakar , Maneesh Keshavan Bendiganavale , Naveena Kedlaya
Abstract: In an example, a first graph representing a first set of combinations of computing elements and logical elements used in a computing environment is compared with a second set of combinations of computing elements and logical elements. The first set of combinations includes a plurality of element combinations. The comparison may be performed to identify a potentially faulty element combination among the first set of combinations.
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公开(公告)号：US10831587B2
公开(公告)日：2020-11-10
申请号：US16048291
申请日：2018-07-29
Applicant: Hewlett Packard Enterprise Development LP
Inventor： Maneesh Keshavan Bendiganavale , Pavan Belur Gopalakrishna Upadhya , Naveena Kedlaya , Vinay Sahadevappa Banakar
IPC: G06F11/07 , G06F16/901 , G06F11/34
Abstract: In an example, suspect scores for impacting elements that can cause an error state of a first element are computed. The computation is performed based on states of each element for which the impacting element can cause the error state.
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公开(公告)号：US20200034222A1
公开(公告)日：2020-01-30
申请号：US16048291
申请日：2018-07-29
Applicant: Hewlett Packard Enterprise Development LP
Inventor： Maneesh Keshavan Bendiganavale , Pavan Belur Gopalakrishna Upadhya , Naveena Kedlaya , Vinay Sahadevappa Banakar
Abstract: In an example, suspect scores for impacting elements that can cause an error state of a first element are computed. The computation is performed based on states of each element for which the impacting element can cause the error state.
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