公开(公告)号：US20230061977A1

公开(公告)日：2023-03-02

申请号：US17793782

申请日：2021-01-19

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Shintaro OTA ,  Osamu MATSUMOTO ,  Kanoh SHIMIZU

IPC: G01N35/00 ,  G01N35/10

Abstract: An automatic analyzer includes a control unit 7d that, when an accuracy control sample is put in after input of a standard sample, requests measurement of the input accuracy control sample on the same measurement item as a requested measurement item for the standard sample; and a selection screen 201 or 501 that enables selection of measurement timing of the accuracy control sample on the same item as the requested measurement item for the standard sample. The control unit 7d starts measurement of the accuracy control sample when the timing selected on the selection screen 201 or 501 is reached. This reduces consumption of the standard sample and reagent as compared with before and provides an automatic analyzer that can improve analysis throughput.

公开(公告)号：US20220026453A1

公开(公告)日：2022-01-27

申请号：US17274797

申请日：2019-11-12

Applicant: HITACHI HIGH-TECH CORPORATION

Inventor： Masayuki ITO ,  Osamu MATSUMOTO ,  Ryota WATANABE

IPC: G01N35/00 ,  G01N35/10

Abstract: The automatic analyzer includes a first storage device that stores sample information including a measurement result of a reaction solution for each sample and a second storage device that stores the sample information on at least a part of the samples among the sample information stored in the first storage device, in which when the automatic analyzer reaches a predetermined operation state, the control device performs a backup process of backing up the sample information on the samples satisfying a predetermined backup condition from the first storage device to the second storage device, and deleting the sample information on the backed up samples from the first storage device.