公开(公告)号：US20230258672A1

公开(公告)日：2023-08-17

申请号：US18136406

申请日：2023-04-19

Applicant: Hitachi High-Technologies Corporation

Inventor： Masashi AKUTSU ,  Naoto SUZUKI ,  Hiroki FUJITA ,  Akihiro YASUI

IPC: G01N35/02 ,  G01N35/00

CPC classification number: G01N35/02 ,  G01N35/00603 ,  G01N2035/00752 ,  G01N2035/00831 ,  G01N27/447

Abstract: This automated analysis device is provided with a plurality of analysis units for analyzing a specimen, a buffer portion which holds a plurality of specimen racks on which are placed specimen containers holding the specimen, a sampler portion which conveys the specimen racks held in the buffer portion to the analysis units, and a control portion which, when performing a process to deliver the specimen racks to the plurality of analysis units, outputs synchronization signals to all the plurality of analysis units, wherein the analysis unit performs a delivery process starting from the synchronization signal, and the analysis unit performs a delivery process starting from the synchronization signal.

公开(公告)号：US20200009572A1

公开(公告)日：2020-01-09

申请号：US16487029

申请日：2018-03-08

Applicant: Hitachi High-Technologies Corporation

Inventor： Akihiro YASUI ,  Akihisa MAKINO ,  Masashi AKUTSU ,  Hiroyuki MISHIMA ,  Yoshihiro SUZUKI

IPC: B01L9/00 ,  G01N35/10 ,  G01N35/02 ,  G01N35/00

Abstract: Provided is an automated analysis device with which sufficient reaction process data can be acquired irrespective of the scale of the device, and with which it is possible to ensure freedom of the device configuration. An automated analysis device 100 is provided with: a reaction disk 1 which circumferentially accommodates a plurality of reaction vessels 2; a specimen dispensing mechanism 11 which dispenses a specimen into the reaction vessels 2; a reagent dispensing mechanism 7 which dispenses a reagent into the reaction vessels 2; a measuring unit 4 which measures a reaction process of a mixture of the specimen and the reagent in the reaction vessels 2; and a cleaning mechanism 3 which cleans the reaction vessels 2 after measurement. Further, the automated analysis device 100 includes a controller 21 which controls the drive of the reaction disk 1 such that in one cycle the reaction vessels 2 move by an amount A in the circumferential direction in such a way that N and A are mutually prime, B and C are mutually prime, and the relationship A×B=N×C±1 holds, where N is the total number of reaction vessels 2 accommodated in the reaction disk 1, the reaction disk 1 moves through C (where C>1) rotations+an amount equivalent to one reaction vessel after B (where B>2) cycles, and the number of reaction vessels 2 moved in one cycle is A (where N>A>N/B+1).

公开(公告)号：US20200271678A1

公开(公告)日：2020-08-27

申请号：US16646410

申请日：2018-10-29

Applicant: Hitachi High-Technologies Corporation

Inventor： Masashi AKUTSU ,  Naoto SUZUKI ,  Hiroki FUJITA ,  Akihiro YASUI

IPC: G01N35/02 ,  G01N35/00

Abstract: This automated analysis device is provided with a plurality of analysis units for analyzing a specimen, a buffer portion which holds a plurality of specimen racks on which are placed specimen containers holding the specimen, a sampler portion which conveys the specimen racks held in the buffer portion to the analysis units, and a control portion which, when performing a process to deliver the specimen racks to the plurality of analysis units, outputs synchronization signals to all the plurality of analysis units, wherein the analysis unit performs a delivery process starting from the synchronization signal, and the analysis unit performs a delivery process starting from the synchronization signal.

公开(公告)号：US20200264201A1

公开(公告)日：2020-08-20

申请号：US16476884

申请日：2018-01-31

Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION

Inventor： Akihisa MAKINO ,  Masashi AKUTSU ,  Hiroyuki MISHIMA ,  Akihiro YASUI

IPC: G01N35/00 ,  G01N35/02

Abstract: An automated analyzer is provided with one or more dispensing lines 109, 209 that are each for loading and unloading, at one end thereof, a sample rack 101 having placed therein one or more sample containers accommodating a sample for analysis and for conveying the sample rack back and forth from a dispensing position for dispensing the sample from the sample containers and sample rack removal parts 111, 211 that are provided adjacent to the other ends of the dispensing lines 109, 209 and provide and receive sample racks to and from the dispensing lines 109, 209. According to this configuration, it is possible to convey an urgent sample while suppressing device complexity, preventing cost from increasing, and also maintaining speed.

公开(公告)号：US20180120340A1

公开(公告)日：2018-05-03

申请号：US15567758

申请日：2016-04-07

Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION

Inventor： Akihiro YASUI ,  Saori CHIDA ,  Masaaki HIRANO

IPC: G01N35/10 ,  G01N21/31

Abstract: Provided is a specimen dispensing mechanism that includes a specimen nozzle dispensing a specimen to be analyzed in a specimen chamber to a reaction chamber by suctioning and ejecting the specimen, and the specimen dispensing mechanism is controlled so as to perform a specimen suctioning process of inserting the specimen nozzle into the specimen chamber and suctioning the specimen in the specimen chamber, a liquid suctioning process of suctioning a liquid by the specimen nozzle after the specimen suctioning process, and an ejection process of ejecting the liquid and a portion of the specimen to the empty reaction chamber from the specimen nozzle in this order. Thereby, it is possible to provide an automatic analyser and a method which are capable of dispensing a small amount of specimen with a high level of accuracy, without depending on the outer shape of a specimen nozzle or the viscosity of the specimen.

公开(公告)号：US20200096529A1

公开(公告)日：2020-03-26

申请号：US16086085

申请日：2017-01-31

Applicant: Hitachi High-Technologies Corporation

Inventor： Saori CHIDA ,  Yoichi ARUGA ,  Akihiro YASUI ,  Yoshiki MURAMATSU ,  Yoko INOUE ,  Hideto TAMEZANE

IPC: G01N35/10 ,  G01N35/04 ,  G01N21/59

Abstract: The automatic analyzer includes: a member to be washed, such as a probe or a stirrer for contacting and stirring a liquid; a wash station in which the member to be washed is washed with a washing liquid; and a measuring part that measures an optical characteristic of an evaluation reagent contained in a reaction cell. A control unit brings the member to be washed that has been washed in the wash station into contact with the evaluation reagent, causes the measuring part to measure the optical characteristic after contact with the evaluation reagent, and calculates the amount of the washing liquid carried into the reaction cell by the member to be washed, based on the measured optical characteristic.

公开(公告)号：US20190317119A1

公开(公告)日：2019-10-17

申请号：US16468761

申请日：2017-11-13

Applicant: Hitachi High-Technologies Corporation

Inventor： Masashi AKUTSU ,  Akihisa MAKINO ,  Hiroyuki MISHIMA ,  Akihiro YASUI

IPC: G01N35/04 ,  G01N35/02 ,  G01N35/00

Abstract: The present invention is provided with a sample rack insertion unit 12 that is capable of holding one or more sample racks 5 having mounted therein one or more sample containers 6 accommodating a sample to be analyzed, one or more analysis devices 2, 3 for analyzing the sample accommodated in the sample containers 6, a sample rack conveyance unit 14 for conveying the sample racks 5 from the sample rack insertion unit 12 to the analysis devices 2, 3, and a control device 4 for acquiring, for each analysis device 2, 3, load information that is information expressing an operating condition of the analysis device 2, 3, and, if there is an analysis device 2, 3 for which the load information is larger than a predetermined conveyance permission value, carrying out control so as to stop the conveyance of the sample racks 5 from the sample rack insertion unit 12 to the analysis device(s) 2, 3. As a result of this configuration, it is possible to mitigate in-device sample conveyance congestion occurring as a result of the insertion of many samples and keep the sample environment and analysis processing power at high levels.

公开(公告)号：US20190049477A1

公开(公告)日：2019-02-14

申请号：US16078063

申请日：2017-01-31

Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION

Inventor： Yoshiki MURAMATSU ,  Akihiro YASUI ,  Yoshihiro SUZUKI ,  Yoichi ARUGA

IPC: G01N35/10 ,  B08B3/04 ,  B08B9/02 ,  B08B5/02 ,  B08B7/04

Abstract: The invention provides a highly reliable automatic analyzer and dispenser probe cleaning method that allows for the removal of leftover cleaning water from the outer wall surfaces of a probe without increasing the size of a cleaning bath and contaminating the outer wall surfaces of the probe. A cleaning bath 113 (108, 106) comprises: a cleaning water outlet 203 for discharging into the cleaning bath 113 (108, 116) the cleaning water supplied from a cleaning water supply mechanism 123; and a compressed air outlet 204, disposed on the trajectory of the cleaning water discharged from the cleaning water outlet 203, for discharging the compressed air supplied from a compressed air supply mechanism 124 toward a sample probe 111b or a reagent probe 120 inserted in the cleaning bath 113 (108, 106).

公开(公告)号：US20200292566A1

公开(公告)日：2020-09-17

申请号：US16646465

申请日：2018-08-23

Applicant: Hitachi High-Technologies Corporation

Inventor： Akihiro YASUI ,  Tatsuya FUKUGAKI ,  Masashi AKUTSU ,  Naoto SUZUKI

IPC: G01N35/00 ,  G01N35/10 ,  G01N35/04

Abstract: Please substitute the new Abstract submitted herewith for the original Abstract: The present invention reduces the turnaround time of an automated analyzer. During a period when cyclic measurement by a measurement unit is unnecessary, a controller washes a reaction vessel using a washing cycle having a cycle time shorter than that of an analysis cycle. A single analysis cycle and a single washing cycle both include a reaction disc stopping period and rotation period. In the washing cycle, there is no time during the stopping period when a sample dispensing mechanism, reagent dispensing mechanism, or stirring mechanism operates but there is a time when a washing mechanism operates. The washing cycle stopping period is shorter than the analysis cycle stopping period. The amount of rotation of the reaction disk in the analysis cycle rotation period is the same as the amount of rotation of the reaction disk in the washing cycle rotation period.

公开(公告)号：US20160363604A1

公开(公告)日：2016-12-15

申请号：US15245237

申请日：2016-08-24

Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION

Inventor： Akihiro YASUI ,  Yoshihiro SUZUKI ,  Hitoshi TOKIEDA

IPC: G01N35/00 ,  G01N35/02 ,  G01N35/04 ,  G01N35/10

CPC classification number: G01N35/0092 ,  G01N35/025 ,  G01N35/04 ,  G01N35/1002 ,  G01N35/1009 ,  G01N2035/0094 ,  G01N2035/0413 ,  G01N2035/0444 ,  G01N2035/1032

Abstract: An automated analyzer maintains high processing capacity and dispensation accuracy even when items requiring dilution/pretreatment and general reaction measurement are mixed. A plurality of sample dispensing mechanisms are independently driven and each include a sample collection position, a sample nozzle for collecting the sample, and a washing tank for washing the sample nozzle. The sample dispensing mechanisms are configured to collect the sample from a plurality of sample collection positions and are operated independently to perform sample dispensation into reaction containers on a reaction disc. At least one of the sample dispensing mechanisms is provided for each of a sample requiring dilution/pretreatment and a sample that does not require dilution/pretreatment. The automated analyzer is provided with a control means for causing the respective mechanisms to be operated in a dedicated manner. The sample is dispensed such that no vacancy is created in the reaction containers.

Abstract translation: 即使在需要稀释/预处理和一般反应测量的物品混合的情况下，自动分析仪也能保持高处理能力和分配精度。 多个样品分送机构被独立地驱动，并且各自包括样品收集位置，用于收集样品的样品喷嘴和用于清洗样品喷嘴的洗涤槽。 样品分配机构被配置为从多个样品收集位置收集样品，并且独立地操作以将样品分配进行到反应盘上的反应容器中。 为需要稀释/预处理的样品和不需要稀释/预处理的样品中的每一个提供至少一个样品分配机构。 自动分析装置设置有用于使各机构以专用方式操作的控制装置。 分配样品使得在反应容器中不产生空位。