公开(公告)号：US11687031B2

公开(公告)日：2023-06-27

申请号：US17128092

申请日：2020-12-19

Applicant: IMEC VZW ,  Katholieke Universiteit Leuven

Inventor： Zhenxiang Luo ,  Abdulkadir Yurt ,  Dries Braeken ,  Liesbet Lagae ,  Richard Stahl

IPC: G03H1/04 ,  G03H1/00 ,  H04N13/254 ,  G02B21/06 ,  G02B21/36

CPC classification number: G03H1/0005 ,  G02B21/06 ,  G02B21/367 ,  G03H1/0443 ,  G03H1/0465 ,  H04N13/254 ,  G03H2001/005 ,  G03H2001/0471 ,  G03H2210/30 ,  G03H2210/55 ,  G03H2222/34 ,  G03H2226/02 ,  G03H2226/11

Abstract: A method for three-dimensional imaging of a sample (302) comprises: receiving (102) interference patterns (208) acquired using light-detecting elements (212), wherein each interference pattern (208) is formed by scattered light from the sample (302) and non-scattered light from a light source (206; 306), wherein the interference patterns (208) are acquired using different angles between the sample (302) and the light source (206; 306); performing digital holographic reconstruction applying an iterative algorithm to change a three-dimensional scattering potential of the sample (302) to improve a difference between the received interference patterns (208) and predicted interference patterns based on the three-dimensional scattering potential; wherein the iterative algorithm reduces a sum of a data fidelity term and a non-differentiable regularization term and wherein the iterative algorithm includes a forward-backward splitting method alternating between forward gradient descent (108) on the data fidelity term and backward gradient descent (110) on the regularization term.

公开(公告)号：US10267998B2

公开(公告)日：2019-04-23

申请号：US15538572

申请日：2015-12-28

Applicant: IMEC VZW

Inventor： Dries Vercruysse ,  Pol Van Dorpe ,  Xavier Rottenberg ,  Tom Claes ,  Richard Stahl

IPC: G02B6/34 ,  G01J3/28 ,  G01N15/14 ,  G02B6/12 ,  G03H1/04

Abstract: Embodiments described herein relate to an imaging device, a method for imaging an object, and a photonic integrated circuit. The imaging device includes at least one photonic integrated circuit. The photonic integrated circuit includes an integrated waveguide for guiding a light signal. The photonic integrated circuit also includes a light coupler optically coupled to the integrated waveguide. The light coupler is adapted for directing the light signal out of a plane of the integrated waveguide as a light beam. The imaging device also includes a microfluidic channel for containing an object immersed in a fluid medium. The microfluidic channel is configured to enable, in operation of the imaging device, illumination of the object by the light beam. In addition, the imaging device includes at least one imaging detector positioned for imaging the object illuminated by the light beam.

公开(公告)号：US20170351034A1

公开(公告)日：2017-12-07

申请号：US15538572

申请日：2015-12-28

Applicant: IMEC VZW

Inventor： Dries Vercruysse ,  Pol Van Dorpe ,  Xavier Rottenberg ,  Tom Claes ,  Richard Stahl

IPC: G02B6/34 ,  G03H1/04 ,  G02B6/12 ,  G01N15/14

CPC classification number: G02B6/34 ,  G01N15/1436 ,  G01N15/1484 ,  G02B6/12 ,  G02B2006/12107 ,  G03H1/0443 ,  G03H2001/0447

Abstract: Embodiments described herein relate to an imaging device, a method for imaging an object, and a photonic integrated circuit. The imaging device includes at least one photonic integrated circuit. The photonic integrated circuit includes an integrated waveguide for guiding a light signal. The photonic integrated circuit also includes a light coupler optically coupled to the integrated waveguide. The light coupler is adapted for directing the light signal out of a plane of the integrated waveguide as a light beam. The imaging device also includes a microfluidic channel for containing an object immersed in a fluid medium. The microfluidic channel is configured to enable, in operation of the imaging device, illumination of the object by the light beam. In addition, the imaging device includes at least one imaging detector positioned for imaging the object illuminated by the light beam.

公开(公告)号：US11946850B2

公开(公告)日：2024-04-02

申请号：US17127980

申请日：2020-12-18

Applicant: IMEC VZW

Inventor： Geert Vanmeerbeeck ,  Ziduo Lin ,  Abdulkadir Yurt ,  Richard Stahl ,  Andy Lambrechts

IPC: G01N15/14 ,  G01N15/1434 ,  G03H1/08 ,  G01N15/06

CPC classification number: G01N15/1434 ,  G03H1/0866 ,  G01N15/06 ,  G01N2015/1454 ,  G01N2015/1486 ,  G03H2001/0883

Abstract: A device for detecting particles in air; said device comprising:



a receiver for receiving a flow of air comprising particles;
a particle capturing arrangement configured to transfer the particles from the flow of air to a liquid for collection of a set of particles in the liquid;
a flow channel configured to pass a flow of the liquid comprising the set of particles through the flow channel;
a light source configured to illuminate the set of particles in the flow channel, such that an interference pattern is formed by interference between light being scattered by the set of particles and non-scattered light from the light source; and
an image sensor comprising a plurality of photo-sensitive elements configured to detect incident light, the image sensor being configured to detect the interference pattern.

公开(公告)号：US20200285194A1

公开(公告)日：2020-09-10

申请号：US16648987

申请日：2018-09-19

Applicant: IMEC VZW

Inventor： Abdulkadir Yurt ,  Richard Stahl ,  Murali Jayapala ,  Geert Vanmeerbeeck

IPC: G03H1/04

Abstract: Example embodiments relate to imaging devices for in-line holographic imaging of objects. One embodiment includes an imaging device for in-line holographic imaging of an object. The imaging device includes a set of light sources configured to output light in confined illumination cones. The imaging device also includes an image sensor that includes a set of light-detecting elements. The set of light sources are configured to output light such that the confined illumination cones are arranged side-by-side and illuminate a specific part of the object. The image sensor is arranged such that the light-detecting elements detect a plurality of interference patterns. Each interference pattern is formed by diffracted light from the object originating from a single light source and undiffracted light from the same single light source. At least a subset of the set of light-detecting elements is arranged to detect light relating to not more than one interference pattern.

公开(公告)号：US10126709B2

公开(公告)日：2018-11-13

申请号：US15727832

申请日：2017-10-09

Applicant: IMEC VZW

Inventor： Richard Stahl ,  Murali Jayapala ,  Andy Lambrechts ,  Geert Vanmeerbeeck

IPC: G03H1/04 ,  G03H1/26 ,  G01N15/14 ,  G01N15/10

Abstract: Embodiments described herein relate to lens-free imaging. One example embodiment may include a lens-free imaging device for imaging a moving sample. The lens-free imaging device may include a radiation source configured to emit a set of at least two different wavelengths towards the moving sample. The lens-free imaging device is configured to image samples for which a spectral response does not substantially vary for a set of at least two different wavelengths. The lens-free imaging device may also include a line scanner configured to obtain a line scan per wavelength emitted by the radiation source and reflected by, scattered by, or transmitted through the moving sample. The line scanner is configured to regularly obtain a line scan per wavelength. Either the radiation source or the line scanner is configured to isolate data of the at least two different wavelengths.

公开(公告)号：US11841298B2

公开(公告)日：2023-12-12

申请号：US17127972

申请日：2020-12-18

Applicant: IMEC VZW

Inventor： Ziduo Lin ,  Abdulkadir Yurt ,  Richard Stahl ,  Geert Vanmeerbeeck ,  Andy Lambrechts

IPC: G01N1/22 ,  G01N15/14 ,  G01N15/06 ,  G01N1/28 ,  G01N15/02

CPC classification number: G01N1/22 ,  G01N15/0612 ,  G01N15/1463 ,  G01N2001/2223 ,  G01N2001/2276 ,  G01N2001/2833 ,  G01N2015/0233

Abstract: The inventive concept relates to a collector for collecting particles in air and a device for detecting particles in air comprising said collector. Said collector comprises a substrate, which is adapted to enable imaging of the particles, an adhesive layer arranged on a collector side of the substrate, said adhesive layer being formed by an adhesive material. The collector further comprises a protection element, which is configured to protect the adhesive layer before collection of particles. The collector is configured to allow release of protection of the adhesive layer by the protection element to expose an adhesive surface of the adhesive layer to ambient air for collecting particles on the adhesive surface. The collector is further configured for presenting a particle sample carrier having a smooth top surface and a smooth bottom surface for preventing light from being diffusely scattered by the particle sample carrier.

公开(公告)号：US11619574B2

公开(公告)日：2023-04-04

申请号：US17127800

申请日：2020-12-18

Applicant: IMEC VZW

Inventor： Geert Vanmeerbeeck ,  Ziduo Lin ,  Abdulkadir Yurt ,  Richard Stahl

IPC: G01N15/06 ,  G01N15/02 ,  G03H1/08

Abstract: The inventive concept relates to a device for detecting particles in air, said device comprising a receiver for receiving a flow of air comprising particles, a sample carrier, and a particle capturing arrangement. The particle capturing arrangement is configured to separate the particles from the flow of air for and to collect a set of particles on a surface of the sample carrier. The device further comprises a light source configured to illuminate the particles on the sample carrier, such that an interference pattern is formed by interference between light being scattered by the particles and non-scattered light from the light source. The device further comprises an image sensor configured to detect the interference pattern. The device further comprises a cleaner configured for cleaning the surface of the sample carrier for enabling re-use of the surface for collection of a subsequent set of particles.

公开(公告)号：US11307533B2

公开(公告)日：2022-04-19

申请号：US16648987

申请日：2018-09-19

Applicant: IMEC VZW

Inventor： Abdulkadir Yurt ,  Richard Stahl ,  Murali Jayapala ,  Geert Vanmeerbeeck

IPC: G02B21/36 ,  G03H1/04

Abstract: Example embodiments relate to imaging devices for in-line holographic imaging of objects. One embodiment includes an imaging device for in-line holographic imaging of an object. The imaging device includes a set of light sources configured to output light in confined illumination cones. The imaging device also includes an image sensor that includes a set of light-detecting elements. The set of light sources are configured to output light such that the confined illumination cones are arranged side-by-side and illuminate a specific part of the object. The image sensor is arranged such that the light-detecting elements detect a plurality of interference patterns. Each interference pattern is formed by diffracted light from the object originating from a single light source and undiffracted light from the same single light source. At least a subset of the set of light-detecting elements is arranged to detect light relating to not more than one interference pattern.

公开(公告)号：US20180046139A1

公开(公告)日：2018-02-15

申请号：US15727832

申请日：2017-10-09

Applicant: IMEC VZW

Inventor： Richard Stahl ,  Murali Jayapala ,  Andy Lambrechts ,  Geert Vanmeerbeeck

IPC: G03H1/04 ,  G01N15/14 ,  G03H1/26

CPC classification number: G03H1/0443 ,  G01N15/1404 ,  G01N15/1429 ,  G01N15/1434 ,  G01N15/147 ,  G01N2015/1006 ,  G01N2015/1454 ,  G01N2015/1472 ,  G01N2015/1486 ,  G03H1/0465 ,  G03H1/2645 ,  G03H2001/0447 ,  G03H2001/0452 ,  G03H2001/266 ,  G03H2210/62 ,  G03H2222/16

Abstract: Embodiments described herein relate to lens-free imaging. One example embodiment may include a lens-free imaging device for imaging a moving sample. The lens-free imaging device may include a radiation source configured to emit a set of at least two different wavelengths towards the moving sample. The lens-free imaging device is configured to image samples for which a spectral response does not substantially vary for a set of at least two different wavelengths. The lens-free imaging device may also include a line scanner configured to obtain a line scan per wavelength emitted by the radiation source and reflected by, scattered by, or transmitted through the moving sample. The line scanner is configured to regularly obtain a line scan per wavelength. Either the radiation source or the line scanner is configured to isolate data of the at least two different wavelengths.