公开(公告)号：US20240175793A1

公开(公告)日：2024-05-30

申请号：US18521145

申请日：2023-11-28

Applicant: Illinois Tool Works Inc.

Inventor： Benjamin Hollander ,  Christopher Joyce

IPC: G01N3/12 ,  G01N3/06

CPC classification number: G01N3/12 ,  G01N3/06 ,  G01N2203/0017 ,  G01N2203/0411

Abstract: Disclosed example apparatus to align a test specimen in a universal testing system include: a first specimen grip configured to be attached to a universal testing system, to hold a test specimen in a first orientation with respect to the universal testing system, and to move the test specimen toward a test axis of the universal testing system; and a specimen stop configured to be attached to the universal testing system and to set a stop point of the test specimen, the first specimen grip and the specimen stop configured to align the test specimen with the test axis.

公开(公告)号：US20240011752A1

公开(公告)日：2024-01-11

申请号：US18348142

申请日：2023-07-06

Applicant: Illinois Tool Works Inc.

Inventor： Benjamin Hollander ,  Adrian Riddick ,  Christopher Joyce ,  Philippe Levesque

IPC: G01B5/06

CPC classification number: G01B5/06

Abstract: Example specimen measurement devices include a clamp; a single actuator configured to control the clamp to position a specimen with a clamping force; a measurement probe configured to contact the clamped specimen with a probing force; and a single position sensor configured to measure a dimension of the clamped specimen based on detecting a position of the measurement probe.