Transistor bridge failure test
    1.
    发明授权

    公开(公告)号:US11686781B2

    公开(公告)日:2023-06-27

    申请号:US16932435

    申请日:2020-07-17

    CPC classification number: G01R31/42 G01R19/16528 G01R31/44 G01R31/50 G01R31/52

    Abstract: A driver circuit arrangement for driving a transistor bridge, which includes at least a first half-bridge composed of a low-side transistor and a high-side transistor, is described herein. In accordance with one example of the description, the circuit includes a current source and a detection circuit. The current source is operably coupled to the high-side transistor of the first half-bridge and configured to supply a test current to the first half bridge. The detection circuit is configured to compare a voltage sense signal, which represents the voltage across the high-side transistor of the first half-bridge, with at least one first threshold to detect, dependent on the result of this comparison, whether a short-circuit is present in the first half-bridge.

    TRANSISTOR BRIDGE FAILURE TEST
    2.
    发明申请

    公开(公告)号:US20170276715A1

    公开(公告)日:2017-09-28

    申请号:US15077524

    申请日:2016-03-22

    Abstract: A driver circuit arrangement for driving a transistor bridge, which includes at least a first half-bridge composed of a low-side transistor and a high-side transistor, is described herein. In accordance with one example of the description, the circuit includes a current source and a detection circuit. The current source is operably coupled to the high-side transistor of the first half-bridge and configured to supply a test current to the first half bridge. The detection circuit is configured to compare a voltage sense signal, which represents the voltage across the high-side transistor of the first half-bridge, with at least one first threshold to detect, dependent on the result of this comparison, whether a short-circuit is present in the first half-bridge.

    Transistor bridge failure test
    3.
    发明授权

    公开(公告)号:US10746806B2

    公开(公告)日:2020-08-18

    申请号:US15077524

    申请日:2016-03-22

    Abstract: A driver circuit arrangement for driving a transistor bridge, which includes at least a first half-bridge composed of a low-side transistor and a high-side transistor, is described herein. In accordance with one example of the description, the circuit includes a current source and a detection circuit. The current source is operably coupled to the high-side transistor of the first half-bridge and configured to supply a test current to the first half bridge. The detection circuit is configured to compare a voltage sense signal, which represents the voltage across the high-side transistor of the first half-bridge, with at least one first threshold to detect, dependent on the result of this comparison, whether a short-circuit is present in the first half-bridge.

    TRANSISTOR BRIDGE FAILURE TEST
    4.
    发明申请

    公开(公告)号:US20200348366A1

    公开(公告)日:2020-11-05

    申请号:US16932435

    申请日:2020-07-17

    Abstract: A driver circuit arrangement for driving a transistor bridge, which includes at least a first half-bridge composed of a low-side transistor and a high-side transistor, is described herein. In accordance with one example of the description, the circuit includes a current source and a detection circuit. The current source is operably coupled to the high-side transistor of the first half-bridge and configured to supply a test current to the first half bridge. The detection circuit is configured to compare a voltage sense signal, which represents the voltage across the high-side transistor of the first half-bridge, with at least one first threshold to detect, dependent on the result of this comparison, whether a short-circuit is present in the first half-bridge.

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