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公开(公告)号:US11686781B2
公开(公告)日:2023-06-27
申请号:US16932435
申请日:2020-07-17
Applicant: Infineon Technologies AG
Inventor: Alexander Heinz , Matthias Bogus
IPC: G01R31/42 , G01R31/44 , G01R31/50 , G01R31/52 , G01R19/165
CPC classification number: G01R31/42 , G01R19/16528 , G01R31/44 , G01R31/50 , G01R31/52
Abstract: A driver circuit arrangement for driving a transistor bridge, which includes at least a first half-bridge composed of a low-side transistor and a high-side transistor, is described herein. In accordance with one example of the description, the circuit includes a current source and a detection circuit. The current source is operably coupled to the high-side transistor of the first half-bridge and configured to supply a test current to the first half bridge. The detection circuit is configured to compare a voltage sense signal, which represents the voltage across the high-side transistor of the first half-bridge, with at least one first threshold to detect, dependent on the result of this comparison, whether a short-circuit is present in the first half-bridge.
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公开(公告)号:US20170276715A1
公开(公告)日:2017-09-28
申请号:US15077524
申请日:2016-03-22
Applicant: Infineon Technologies AG
Inventor: Alexander Heinz , Matthias Bogus
IPC: G01R31/02 , G01R19/165
Abstract: A driver circuit arrangement for driving a transistor bridge, which includes at least a first half-bridge composed of a low-side transistor and a high-side transistor, is described herein. In accordance with one example of the description, the circuit includes a current source and a detection circuit. The current source is operably coupled to the high-side transistor of the first half-bridge and configured to supply a test current to the first half bridge. The detection circuit is configured to compare a voltage sense signal, which represents the voltage across the high-side transistor of the first half-bridge, with at least one first threshold to detect, dependent on the result of this comparison, whether a short-circuit is present in the first half-bridge.
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公开(公告)号:US10746806B2
公开(公告)日:2020-08-18
申请号:US15077524
申请日:2016-03-22
Applicant: Infineon Technologies AG
Inventor: Alexander Heinz , Matthias Bogus
IPC: G01R31/50 , G01R31/44 , G01R31/42 , G01R19/165
Abstract: A driver circuit arrangement for driving a transistor bridge, which includes at least a first half-bridge composed of a low-side transistor and a high-side transistor, is described herein. In accordance with one example of the description, the circuit includes a current source and a detection circuit. The current source is operably coupled to the high-side transistor of the first half-bridge and configured to supply a test current to the first half bridge. The detection circuit is configured to compare a voltage sense signal, which represents the voltage across the high-side transistor of the first half-bridge, with at least one first threshold to detect, dependent on the result of this comparison, whether a short-circuit is present in the first half-bridge.
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公开(公告)号:US20200348366A1
公开(公告)日:2020-11-05
申请号:US16932435
申请日:2020-07-17
Applicant: Infineon Technologies AG
Inventor: Alexander Heinz , Matthias Bogus
IPC: G01R31/50 , G01R31/44 , G01R31/42 , G01R19/165
Abstract: A driver circuit arrangement for driving a transistor bridge, which includes at least a first half-bridge composed of a low-side transistor and a high-side transistor, is described herein. In accordance with one example of the description, the circuit includes a current source and a detection circuit. The current source is operably coupled to the high-side transistor of the first half-bridge and configured to supply a test current to the first half bridge. The detection circuit is configured to compare a voltage sense signal, which represents the voltage across the high-side transistor of the first half-bridge, with at least one first threshold to detect, dependent on the result of this comparison, whether a short-circuit is present in the first half-bridge.
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