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公开(公告)号：US20210333366A1
公开(公告)日：2021-10-28
申请号：US16855196
申请日：2020-04-22
Applicant: Infineon Technologies AG
Inventor： Norbert DRUML , Philipp GREINER , Hermann HOFER , Ievgeniia MAKSYMOVA
Abstract: An oscillator control system that includes an oscillator structure; a phase error detector configured to generate a phase error signal based on a delayed event time signal and delayed reference signal; an analog signal path coupled between the oscillator structure and the phase error detector, the analog signal path configured to receive an event time signal and produce the delayed event time signal; a control circuit configured to generate a reference signal; a programmable delay circuit configured to receive the reference signal and induce a programmable delay on the reference signal thereby generating the delayed reference signal; and an analog delay measurement circuit configured to inject a test signal into the analog signal path, receive a delayed test signal from the analog signal path, measure an analog delay of the delayed test signal, and generate a configuration signal configured to adjust the programmable delay according to the measured analog delay.
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公开(公告)号：US20220018941A1
公开(公告)日：2022-01-20
申请号：US16931876
申请日：2020-07-17
Applicant: Infineon Technologies AG
Inventor： Norbert DRUML , Philipp GREINER
IPC: G01S7/481 , G01S7/4863 , G01S17/08
Abstract: A scanning system includes a scanning structure configured to rotate about at least one first scanning axis; a driver configured to drive the scanning structure about the at least one first scanning axis and detect a position of the scanning structure with respect to the at least one first scanning axis during movement of the scanning structure; a segmented pixel sensor including a plurality of sub-pixel elements arranged in a pixel area; and a controller configured to selectively activate and deactivate the plurality of sub-pixel elements into at least one active cluster and at least one deactivated cluster to form at least one active pixel from the at least one active cluster, receive first position information from the driver indicating the detected position of the scanning structure, and dynamically change a clustering of activated sub-pixel elements and a clustering of deactivated sub-pixel elements based on the first position information.
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公开(公告)号：US20200159005A1
公开(公告)日：2020-05-21
申请号：US16196786
申请日：2018-11-20
Applicant: Infineon Technologies AG
Inventor： Norbert DRUML , Philipp GREINER , Ievgeniia MAKSYMOVA
Abstract: A system may include a micro-electro-mechanical systems (MEMS) mirror and a MEMS driver circuit. The MEMS driver circuit may obtain a plurality of items of monitoring information associated with the MEMS mirror. The plurality of items of monitoring information may include at least one of sensor information received from one or more sensors associated with the MEMS mirror, or operation information received from a controller associated with the system. The MEMS driver circuit may determine a state of the MEMS mirror based on the plurality of items of monitoring information. The MEMS driver circuit may adapt a mirror control parameter, associated with controlling the MEMS mirror, based on the state of the MEMS mirror.
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4.发明申请公开(公告)号：US20200011976A1
公开(公告)日：2020-01-09
申请号：US16039876
申请日：2018-07-19
Applicant: Infineon Technologies AG
Inventor： Norbert DRUML , Philipp GREINER , Ievgeniia MAKSYMOVA
Abstract: Systems and methods are provided for compensating errors. A system includes a microelectromechanical systems (MEMS) oscillating structure configured to oscillate about a rotation axis; a phase error detector configured to generate a phase error signal based on measured event times and expected event times of the MEMS oscillating structure oscillating about the rotation axis; and a compensation circuit configured to receive the phase error signal, remove periodic jitter components in the phase error signal to generate a compensated phase error signal, and output the compensated phase error signal.
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公开(公告)号：US20180259628A1
公开(公告)日：2018-09-13
申请号：US15909163
申请日：2018-03-01
Applicant: Infineon Technologies AG
Inventor： Hannes PLANK , Norbert DRUML , Armin SCHOENLIEB
CPC classification number: G01S7/4865 , G01S7/4863 , G01S7/497 , G01S17/36 , G01S17/89
Abstract: A time of flight imaging apparatus includes a plurality of sensor pixels configured to receive an external light signal modulated with an external modulation frequency. The time of flight imaging apparatus further includes pixel circuitry configured to generate a sensor pixels output signal based on the external light signal and a reference signal having a reference frequency. The sensor pixels output signal has a frequency depending on a difference between the external modulation frequency and the reference frequency. The time of flight imaging apparatus further includes synchronization circuitry configured to adjust the reference frequency of the reference signal based on the sensor pixels output signal.
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Patent Agency Ranking
公开(公告)号：US20250110330A1
公开(公告)日：2025-04-03
申请号：US18980107
申请日：2024-12-13
Applicant: Infineon Technologies AG
Inventor： Han Woong YOO , Stephan Gerhard ALBERT , David BRUNNER , Norbert DRUML , Selma KARIC , Leonhard NIEDERMUELLER , Georg SCHITTER , Richard SCHROEDTER
Abstract: A method of Lissajous scanning includes driving a first oscillator structure about a first rotation axis at a first resonance frequency according to a first driving signal, and driving a second oscillator structure about a second rotation axis at a second resonance frequency according to second driving signal different from the first resonance frequency. The first driving signal has a first low level, a first high level, and a first duty cycle, the combination of which produces the first resonance frequency, and the second driving signal has a second low level, a second high level, and a second duty cycle, the combination of which produces the second resonance frequency. At least one of the second low level, the second high level, and the second duty cycle is different from the first low level, the first high level, and the first duty cycle, respectively.
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7.发明公开公开(公告)号：US20240069329A1
公开(公告)日：2024-02-29
申请号：US17823404
申请日：2022-08-30
Applicant: Infineon Technologies AG
Inventor： Norbert DRUML , Alberto GARCIA IZQUIERDO
CPC classification number: G02B26/101 , G02B26/0833 , G01S7/4817 , H03L7/0992
Abstract: A method of synchronizing a first oscillation about a first axis with a second oscillation about a second axis includes: generating a first position signal that indicates a position of the first oscillation about the first axis; generating a second position signal that indicates a position of the second oscillation about the first axis; determining a phase difference between the first and the second position signals; comparing the phase difference to a threshold value to generate a comparison result; generating a first reference signal having a first frequency and a second reference signal having a second frequency; synchronizing the first oscillation to the first frequency and synchronizing the second oscillation to the second frequency; monitoring the comparison result; and synchronously triggering a start of the first reference signal and the second reference signal responsive to the comparison result indicating that the phase difference is less than the threshold value.
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公开(公告)号：US20220065995A1
公开(公告)日：2022-03-03
申请号：US17003154
申请日：2020-08-26
Applicant: Infineon Technologies AG
Inventor： Norbert DRUML
IPC: G01S7/481 , G01S17/34 , G01S7/4911
Abstract: A scanning system includes a transmitter, a scanning structure, and a controller. The transmitter is configured to transmit a frequency modulated continuous wave (FMCW) light beam that includes a plurality of frequency ramps including up-chirps and down-chirps that are matched into up-down chirp pairs. The scanning structure is configured to oscillate about a scanning axis such that a deflection angle of the scanning structure continuously varies over time in an angular range between two maximum deflection angles. The controller is configured to segment the angular range into a plurality of sub-angular ranges and assign each up-down chirp pair to a different sub-angular range of the plurality of sub-angular ranges. Each up-down chirp pair includes an up-chirp transmitted in an assigned sub-angular range during a first scanning movement of the scanning structure and a down-chirp transmitted in the assigned sub-angular range during a second scanning movement of the scanning structure.
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公开(公告)号：US20200319450A1
公开(公告)日：2020-10-08
申请号：US16376544
申请日：2019-04-05
Applicant: Infineon Technologies AG
Inventor： Norbert DRUML , Philipp GREINER , Boris KIRILLOV , Ievgeniia MAKSYMOVA , Maksym SLADKOV , Hendrikus VAN LIEROP
Abstract: A multi-mirror system includes a first mirror configured to oscillate about a first axis; a second mirror configured to oscillate about a second axis; a first driver configured to drive an oscillation of the first mirror, detect first zero-crossing events of the first mirror, and generate a first position signal based on the detected first zero-crossing events; a second driver configured to drive an oscillation of the second mirror, detect second zero-crossing events of the second mirror, and generate a second position signal based on the detected second zero-crossing events; and a synchronization controller configured to receive the first and the second position signals, and synchronize at least one of a phase or a frequency of the oscillation of the second mirror with at least one of a phase or a frequency of the oscillation of the first mirror, respectively, based on the first and the second position signals.
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公开(公告)号：US20190291743A1
公开(公告)日：2019-09-26
申请号：US15934041
申请日：2018-03-23
Applicant: Infineon Technologies AG
Inventor： Norbert DRUML
Abstract: An object sensor test system includes a sensor and a test bench. The sensor includes a test interface configured to receive test data and at least one control signal, selectively inject the test data into a selected input of a processing chain based on the at least one control signal, and selectively extract processed test data at a selected output of the processing chain based on the at least one control signal. The test bench is configured to transmit the test data and the at least one control signal to the test interface, receive the processed test data from the sensor, compare the received processed test data with expected data to generate a comparison result, and determine that a segment of the processing chain is operating normally or abnormally based on the comparison result.
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