Abstract:
An apparatus for viewing images of a gemstone is described. The apparatus comprises a support structure for supporting the gemstone at an observation position. An illumination structure comprises a plurality of directional light sources directed towards the observation position so as to illuminate the gemstone. The support structure and illumination structure are relatively rotatable relative to one another about a rotation axis. An imaging device is arranged to obtain images of the gemstone at the observation position at a variety of relative rotational positions between the illumination structure and support structure: the imaging device has an imaging axis passing through the observation position. The support structure is arranged so that the gemstone can be placed at the observation position in such a way that the normal to a selected facet of the gemstone is within a range of tilt angles from the rotation axis. The arrangement of directional light sources is such that, for any tilt angle within the range, at least one of the directional light sources will be specularly reflected from the selected facet into the imaging device for at least one rotational position of the support structure.
Abstract:
An apparatus for viewing images of a gemstone is described. The apparatus comprises a support structure for supporting the gemstone at an observation position. An illumination structure comprises a plurality of directional light sources directed towards the observation position so as to illuminate the gemstone. The support structure and illumination structure are relatively rotatable relative to one another about a rotation axis. An imaging device is arranged to obtain images of the gemstone at the observation position at a variety of relative rotational positions between the illumination structure and support structure: the imaging device has an imaging axis passing through the observation position. The support structure is arranged so that the gemstone can be placed at the observation position in such a way that the normal to a selected facet of the gemstone is within a range of tilt angles from the rotation axis. The arrangement of directional light sources is such that, for any tilt angle within the range, at least one of the directional light sources will be specularly reflected from the selected facet into the imaging device for at least one rotational position of the support structure.
Abstract:
A system is described for obtaining images of a gemstone, and performing quantitative analysis on the images to obtain measures of properties of the gemstone. The system comprises a support structure for supporting the gemstone at an observation position. An illumination structure is arranged to illuminate the gemstone. The illumination structure comprises a plurality of radially dispersed directional light sources directed towards the observation position, the support structure and illumination system being rotatable relative to one another around a rotation axis so that the gemstone can be illuminated by one or more of the directional light sources at each of a plurality of rotational positions, the axis of rotation being normal to a selected facet of the gemstone. An imaging device is directed towards the gemstone for obtaining images of the gemstone at each of the rotational positions, the imaging device having an imaging axis parallel to or coincident with the axis of rotation. An image processor is provided for identifying sparkle regions in the images corresponding to reflections from individual light sources by individual facets and providing a quantitative measure of the gemstone on the basis of porperties of the sparkle regions.
Abstract:
An invisible information mark is provided on a facet of a diamond gemstone by applying a plasma resist to the exposed surface of the gemstone, applying an electrically conducting layer of metal to the region where the information mark is to be formed, ablating a selected zone of the metal and resist layers by ultraviolet laser thus forming a mask on the surface of the facet, electrically connecting the metal layer and plasma etching the facet through the mask, thus forming a mark of appropriate depth on the surface of the gemstone.
Abstract:
A system is described for obtaining images of a gemstone, and performing quantitative analysis on the images to obtain measures of properties of the gemstone. The system comprises a support structure for supporting the gemstone at an observation position. An illumination structure is arranged to illuminate the gemstone. The illumination structure comprises a plurality of radially dispersed directional light sources directed towards the observation position, the support structure and illumination system being rotatable relative to one another around a rotation axis so that the gemstone can be illuminated by one or more of the directional light sources at each of a plurality of rotational positions, the axis of rotation being normal to a selected facet of the gemstone. An imaging device is directed towards the gemstone for obtaining images of the gemstone at each of the rotational positions, the imaging device having an imaging axis parallel to or coincident with the axis of rotation. An image processor is provided for identifying sparkle regions in the images corresponding to reflections from individual light sources by individual facets and providing a quantitative measure of the gemstone on the basis of porperties of the sparkle regions.
Abstract:
In order to test whether a diamond has had a layer of synthetic diamond material deposited thereon, infrared radiation including radiation of wavelength substantially 7 .mu.m to 25 .mu.m preferably 7 .mu.m to 10 .mu.m emitted or transmitted by the diamond is observed, to detect differences between the compositions of different zones of the diamond.
Abstract:
A method and apparatus for generating a 3D model of and/or detecting inclusions in a polished gemstone such as diamond is described. The gemstone (103) is rotated in a series of discrete increments. At each rotational position of the gemstone, the gemstone (103) is illuminated with collimated light (111,112) and a silhouette image recorded. At each rotational position, the gemstone (103) is also (before further rotation) illuminated with diffuse light (109), and a diffuse image recorded. The images are analyzed to obtain a 3D model of the surface of the gemstone. Features may then be identified in the diffuse images and tracked between subsequent diffuse images. The tracked features may be located relative to the 3D model of the gemstone, taking into account reflection and refraction of light rays by the gemstone. Some or all of the located features may then be identified as inclusions.
Abstract:
An information mark invisible to the naked eye is applied to the polished facet of a diamond gemstone by coating the diamond gemstone surface with an electrically conductive layer so as to prevent the diamond becoming charged, forming the mark with a focused ion beam, and cleaning the diamond surface with a powerful oxidizing agent to reveal a mark having an appropriate depth, which does not detrimentally affect the clarity or color grade of the diamond.
Abstract:
In order to test whether a diamond has had a layer of synthetic diamond deposited thereon, the surface area of the natural part of the stone is measured by measuring the radiant-flux density of radiation substantially of wavelength 230 nm to 320 nm in an integrating sphere containing the diamond. This is compared to the total surface area of the diamond.
Abstract:
In order to test whether a diamond 2 comprises synthetic diamond material, a plurality of different zones of the diamond 2 are irradiated with radiation substantially of wavelength substantially 230 nm to 320 nm, an image or reading of the radiation transmitted by each zone of the diamond 2 being produced.