Abstract:
Error diffusion is performed upon input image data. In one aspect, multiple error diffusion processing elements perform error diffusion on a selected pixel in parallel. In another aspect, the error diffusion logic is integrally formed with a fast local memory in the same electronic device, such as an ASIC. The error data produced by the error diffusion logic for a pixel is buffered in the fast local memory until it is to be used by the error diffusion logic on other pixels. In still another aspect, a first-in-first-out (FIFO) buffer regulates or buffers the color image data between the output of a color conversion system, such as a colorant lookup table, and the input an error diffusion processing element. In yet another aspect, the error diffusion logic has tagging logic that produces and stores an indicator, either in the output data stream itself or in a separate area, to indicate whether a raster contains printable data.
Abstract:
A system for testing or debugging a device under test having an embedded logic analyzer. In one embodiment, the system includes software stored in non-transitory memory for testing a device under test having an embedded logic analyzer, the software program product having instructions which, when executed by a computing device associated with the device under test cause the computing device to reconstruct signals of interest in the device under test based at least in part upon signals captured by the embedded logic analyzer during the test or debug session, and cause the computing device to display the reconstructed signals of interest to a user of the computing device.
Abstract:
A system for testing or debugging a device under test having an embedded logic analyzer. In one embodiment, the system includes software stored in non-transitory memory for testing a device under test having an embedded logic analyzer, the software program product having instructions which, when executed by a computing device associated with the device under test cause the computing device to reconstruct signals of interest in the device under test based at least in part upon signals captured by the embedded logic analyzer during the test or debug session, and cause the computing device to display the reconstructed signals of interest to a user of the computing device.
Abstract:
An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefor. In one embodiment of the present invention, an embedded logic analyzer (ELA) receives a plurality of signals from a plurality of buses within an integrated circuit (IC). The ELA includes an interconnect module to select a trigger signal and/or a sampled signal from the plurality of received signals. A trigger module sets at least one trigger condition and detects if the trigger signal satisfies the at least one trigger condition. When the trigger condition is satisfied, an output module performs at least one task based upon the satisfied at least one trigger condition. If a sampling process is initiated by the output module, the plurality of sampled signals is sampled and may be stored in a memory. The capability of the output module to perform multiple user-defined tasks enhances the debugging capability of the ELA and makes it more versatile.
Abstract:
An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefor. In one embodiment of the present invention, an embedded logic analyzer (ELA) receives a plurality of signals from a plurality of buses within an integrated circuit (IC). The ELA includes an interconnect module to select a trigger signal and/or a sampled signal from the plurality of received signals. A trigger module sets at least one trigger condition and detects if the trigger signal satisfies the at least one trigger condition. When the trigger condition is satisfied, an output module performs at least one task based upon the satisfied at least one trigger condition. If a sampling process is initiated by the output module, the plurality of sampled signals is sampled and may be stored in a memory. The capability of the output module to perform multiple user-defined tasks enhances the debugging capability of the ELA and makes it more versatile.
Abstract:
An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefore. In one embodiment, an integrated circuit includes a logic analyzer having a first input receiving a plurality of signals and an output for providing an indication of a detection, by the logic analyzer, of at least one trigger event; and a built in self test block having a first input for receiving one or more of the signals appearing at the first input of the logic analyzer, a second input coupled to the output of the logic analyzer for selectively enabling the BIST block, the BIST block generating and maintaining a signature based upon the first and second inputs thereof.
Abstract:
An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefor. In one embodiment of the present invention, an embedded logic analyzer (ELA) receives a plurality of signals from a plurality of buses within an integrated circuit (IC). The ELA includes an interconnect module to select a trigger signal and/or a sampled signal from the plurality of received signals. A trigger module sets at least one trigger condition and detects if the trigger signal satisfies the at least one trigger condition. When the trigger condition is satisfied, an output module performs at least one task based upon the satisfied at least one trigger condition. If a sampling process is initiated by the output module, the plurality of sampled signals is sampled and may be stored in a memory. The capability of the output module to perform multiple user-defined tasks enhances the debugging capability of the ELA and makes it more versatile.
Abstract:
Lines of input image data are scaled in a first dimension, the one-dimensionally scaled lines are stored in a buffer memory until a sufficient number of lines have been stored to perform scaling equally in two dimensions, and the stored lines are then scaled in a second dimension to produce image data scaled two-dimensionally by a user-selected scaling percentage. A first image scaling method is used to scale the input image data if the user-selected scaling percentage exceeds a predetermined threshold value, such as 50 percent, and a second scaling method is used if the scaling percentage does not exceed the threshold value. The first method can be, for example, linear interpolation, and the second method can be, for example, averaging.
Abstract:
A method for detecting and correcting firmware corruption in a system having a host communicatively coupled to an electronic apparatus, the electronic apparatus having a hardware unit communicatively coupled to a non-volatile memory, includes determining via the hardware unit whether firmware on the non-volatile memory is corrupted; if the firmware is determined to be corrupted, then: invoking a communication driver resident in the hardware unit to establish bi-directional communications between the host and the electronic apparatus; and initiating a firmware download from the host to update the firmware on the non-volatile memory to an uncorrupted state.
Abstract:
A method for performing a division operation in a system includes a) determining an approximate quotient of a numerator value and a denominator value; b) determining an initial error of the approximate quotient; c) determining a quotient adjustment value based on the initial error; d) determining whether to apply the quotient adjustment value to the approximate quotient; e) if the determination at d) is YES, then applying the quotient adjustment value to the approximate quotient; f) determining an iterative error of the approximate quotient; g) updating the quotient adjustment value based on the iterative error; h) repeating acts d) through g) until the determination at d) is NO, thereby determining a final value for the approximate quotient; i) generating an integer quotient based on the final value of the approximate quotient; and j) using the integer quotient with regard to at least one aspect of the system.