公开(公告)号：US09874597B2

公开(公告)日：2018-01-23

申请号：US14696891

申请日：2015-04-27

Applicant: KLA-TENCOR CORPORATION

Inventor： Mark McCord ,  Alan Brodie ,  James George ,  Yu Guan ,  Ralph Nyffenegger

IPC: G01R31/26

CPC classification number: G01R31/2635 ,  G01R31/2601

Abstract: Light-emitting devices, such as LEDs, are tested using a photometric unit. The photometric unit, which may be an integrating sphere, can measure flux, color, or other properties of the devices. The photometric unit may have a single port or both an inlet and outlet. Light loss through the port, inlet, or outlet can be reduced or calibrated for. These testing systems can provide increased reliability, improved throughput, and/or improved measurement accuracy.

公开(公告)号：US20150316411A1

公开(公告)日：2015-11-05

申请号：US14699880

申请日：2015-04-29

Applicant: KLA-TENCOR CORPORATION

Inventor： Mark McCord ,  Yu Guan ,  James George

IPC: G01J1/18 ,  G01J1/04 ,  G01J3/02 ,  H05B33/08

CPC classification number: G01J1/04 ,  G01J1/0252 ,  G01J1/0403 ,  G01J1/18 ,  G01J1/42 ,  G01J3/0251 ,  G01J3/0286 ,  G01J2001/1673 ,  G01J2001/4247 ,  H05B33/0815 ,  H05B33/089

Abstract: The present disclosure provides methods and apparatus for testing light-emitting diodes (LEDs), for example, measuring the optical radiation of an LED. In a method, a pulse-width modulated signal is provided to the LED. One or more characteristics of the PWM signal are varied so as to provide a forward voltage, Vf, corresponding to a target junction temperature, Tj, of the LED. The optical radiation of the LED is measured when the LED obtains the target junction temperature.

Abstract translation: 本公开提供了用于测试发光二极管（LED）的方法和装置，例如测量LED的光辐射。 在一种方法中，向LED提供脉冲宽度调制信号。 改变PWM信号的一个或多个特性以提供对应于LED的目标结温Tj的正向电压Vf。 当LED获得目标结温时，测量LED的光辐射。