公开(公告)号：US11908123B2

公开(公告)日：2024-02-20

申请号：US17256497

申请日：2019-04-16

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Choung Min Jung ,  Ho Jun Lee ,  Nam Kyu Park ,  Han Rim Kim

IPC: G06T7/00 ,  G01N21/01 ,  G01N21/88 ,  G06T7/40 ,  H04N23/695

CPC classification number: G06T7/0004 ,  G01N21/01 ,  G01N21/88 ,  G06T7/40 ,  H04N23/695 ,  G01N2021/0106 ,  G01N2021/0187 ,  G06T2207/30108

Abstract: An object inspection apparatus according to an embodiment disclosed herein includes: a first flipper apparatus configured to rotate a first object; a second flipper apparatus configured to rotate a second object; and a single camera device configured to move from a position corresponding to one of the first flipper apparatus and the second flipper apparatus to a position corresponding to the other, the camera device being configured to inspect object surfaces of the first object and the second object. Each of the first flipper apparatus and the second flipper apparatus includes at least one flipper unit.