公开(公告)号：US20160025649A1

公开(公告)日：2016-01-28

申请号：US14781953

申请日：2014-04-01

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Hyun-Seok LEE ,  Jae-Sik YANG ,  Ja-Geun KIM ,  Hee-Tae KIM ,  Hee-Wook YOU

IPC: G01N21/94 ,  G06T7/00 ,  G06T11/60 ,  G01N21/88

CPC classification number: G01N21/94 ,  G01N21/8806 ,  G01N2021/8845 ,  G01N2021/95638 ,  G01N2201/061 ,  G01N2201/13 ,  G06T7/001 ,  G06T11/60 ,  G06T2207/10004 ,  G06T2207/10024 ,  G06T2207/30141

Abstract: In order to inspect a substrate, an image information of a substrate before applying solder is displayed. Then, at least one inspection region on the substrate is image-captured to obtain an image of the inspection region that is image-captured. Then, image information that is to be displayed is renewed and the renewed image information is displayed. And, in order to inspect a foreign substance, obtained image of the inspection region is compared with a reference image of the substrate. Therefore, an operator can easily catch a region corresponding to a specific region of the image that is displayed, and easily detect a foreign substance on the substrate.

Abstract translation: 为了检查基板，显示在施加焊料之前的基板的图像信息。 然后，对基板上的至少一个检查区域进行图像拍摄，以获得被图像捕获的检查区域的图像。 然后，更新要显示的图像信息，并显示更新的图像信息。 并且，为了检查异物，将获得的检查区域的图像与基板的参考图像进行比较。 因此，操作者可以容易地捕捉与所显示的图像的特定区域对应的区域，并容易地检测基板上的异物。