公开(公告)号：US20210207954A1

公开(公告)日：2021-07-08

申请号：US17212219

申请日：2021-03-25

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Seung-Jun LEE ,  Kwangill KOH ,  Moon-Young JEON ,  Sang-Kyu YUN ,  Hong-Min KIM ,  Jung HUR

IPC: G01B11/25 ,  G01B11/245 ,  H04N5/247

Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.

公开(公告)号：US20130263078A1

公开(公告)日：2013-10-03

申请号：US13852077

申请日：2013-03-28

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Joong-Ki JEONG ,  Seung-Jun LEE

IPC: G06F17/50

CPC classification number: G06F17/5081

Abstract: A method for generating PCB inspection task data and inspecting a PCB is disclosed. The method by which Gerber data and CAD coordinate file generated at the time of PCB designing is matched to each other facilitates to generate a task data and allows a higher inspection accuracy. The task data generating method comprises generating a Gerber data comprising information for pads on the PCB, loading a CAD coordinate file comprising a coordinate of a component mounted on the pads, inferring a shape of lead and body of the component within a pad area by matching the Gerber data and CAD coordinate file, and then setting a pad area where a tip-end of the body locates as an inspection area.

Abstract translation: 公开了一种用于生成PCB检查任务数据和检查PCB的方法。 在PCB设计时生成的Gerber数据和CAD坐标文件相互匹配的方法有助于生成任务数据并允许更高的检查精度。 任务数据生成方法包括生成Gerber数据，其包括PCB上的焊盘的信息，加载包括安装在焊盘上的部件的坐标的CAD坐标文件，通过匹配来推断焊盘区域内的部件的引线和主体的形状 Gerber数据和CAD坐标文件，然后设置身体顶端位置的垫区域作为检查区域。

公开(公告)号：US20140125375A1

公开(公告)日：2014-05-08

申请号：US14072178

申请日：2013-11-05

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Seung-Jun LEE ,  Moon-Young JEON ,  Nam Ho LEE

IPC: G01R31/28

CPC classification number: G01R31/2805 ,  G05B19/41875 ,  G05B2219/37217 ,  G05B2219/45026 ,  H05K13/08 ,  H05K13/0817 ,  H05K13/083

Abstract: A board inspection apparatus system includes a first apparatus, a second apparatus, a third apparatus and an information transfer section. The first apparatus acquires first three-dimensional information of a solder paste on a board, and inspects whether the solder paste is formed good by a first tolerance based on the first three-dimensional information. The second apparatus mounts an electronic component on the board to join the electronic component and the solder paste. The third apparatus acquires second three-dimensional information of a solder joint, and inspects whether the electronic component is mounted good by a second tolerance based on the second three-dimensional information. The information transfer section transfers the first three-dimensional information to the third apparatus, or transfers the second three-dimensional information to the first apparatus. Thus, a more effective inspection condition may be established, and a rate of defect for each apparatus may be greatly reduced.

Abstract translation: 板检查装置系统包括第一装置，第二装置，第三装置和信息传送部。 第一装置获取板上的焊膏的第一三维信息，并且基于第一三维信息检查焊膏是否通过第一公差形成良好。 第二装置将电子部件安装在电路板上以连接电子部件和焊膏。 第三装置获取焊点的第二三维信息，并且基于第二三维信息检查电子部件是否良好地被安装好第二公差。 信息传送部将第一三维信息传送到第三装置，或将第二三维信息传送到第一装置。 因此，可以建立更有效的检查条件，并且可以大大降低每个装置的缺陷率。

公开(公告)号：US20190293413A1

公开(公告)日：2019-09-26

申请号：US15929142

申请日：2019-06-12

Applicant: KOH YOUNG TECHNOLOGY INC

Inventor： Seung-Jun LEE ,  Kwangill KOH ,  Moon-Young JEON ,  Sang-Kyu YUN ,  Hong-Min KIM ,  Jung HUR

IPC: G01B11/25 ,  H04N5/247 ,  G01B11/245

Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.

公开(公告)号：US20140354804A1

公开(公告)日：2014-12-04

申请号：US14463269

申请日：2014-08-19

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Seung-Jun LEE ,  Kwang-Ill KHO ,  Moon-Young JEON ,  Sang-Kyu YUN ,  Hong-Min KIM ,  Jung HUR

IPC: G01B11/25 ,  H04N5/247

CPC classification number: G01B11/2513 ,  G01B11/245 ,  G02B27/40 ,  H04N5/247

Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.

公开(公告)号：US20130215262A1

公开(公告)日：2013-08-22

申请号：US13853746

申请日：2013-03-29

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Joong-Ki JEONG ,  Yu-Jin LEE ,  Seung-Jun LEE ,  Bong-Ha HWANG

IPC: G01R31/309

CPC classification number: G01R31/309 ,  G01B11/2531 ,  G06T7/521

Abstract: An inspection method includes photographing a measurement target to acquire image data for each pixel of the measurement target, acquiring height data for each pixel of the measurement target, acquiring visibility data for each pixel of the measurement target, multiplying the acquired image data by at least one of the height data and the visibility data for each pixel to produce a result value, and setting a terminal area by using the produced result value. Thus, the terminal area may be accurately determined.

Abstract translation: 检查方法包括拍摄测量对象以获取测量对象的每个像素的图像数据，获取测量对象的每个像素的高度数据，获取测量对象的每个像素的可见度数据，至少将所获取的图像数据乘以 为每个像素生成结果值的高度数据和可见度数据之一，以及通过使用所产生的结果值来设置终端区域。 因此，终端区域可以被准确地确定。

公开(公告)号：US20250067559A1

公开(公告)日：2025-02-27

申请号：US18944327

申请日：2024-11-12

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Seung-Jun LEE ,  Kwangill KOH ,  Moon-Young JEON ,  Sang-Kyu YUN ,  Hong-Min KIM ,  Jung HUR

IPC: G01B11/25 ,  G01B11/245 ,  G02B27/40 ,  H04N23/90

Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.

公开(公告)号：US20140354805A1

公开(公告)日：2014-12-04

申请号：US14463287

申请日：2014-08-19

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Seung-Jun LEE ,  Kwang-III Kho ,  Moon-Young Jeon ,  Sang-Kyu Yun ,  Hong-Min Kim ,  Jung Hur

IPC: G01B11/25

CPC classification number: G01B11/2513 ,  G01B11/245 ,  G02B27/40 ,  H04N5/247

Abstract: Provided are an apparatus and a method for measuring a three dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light to the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three dimensional shape of the object in a rapid and accurate manner.

Abstract translation: 提供了一种以提高的精度测量三维形状的装置和方法。 该装置包括舞台，至少一个照明单元，多个摄像单元和控制单元。 舞台支持要测量的对象。 照明单元包括光源和栅格，并且将栅格图案的光辐射到待测量的对象。 图像拾取单元在不同方向捕获从待测对象反射的网格图像。 控制单元从由摄像单元拍摄的网格图像计算物体的三维形状。 本发明通过主要图像拾取部分和子图像拾取部分捕获网格图像具有能够以快速和准确的方式测量对象的三维形状的优点。

公开(公告)号：US20130222578A1

公开(公告)日：2013-08-29

申请号：US13860228

申请日：2013-04-10

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Joong-Ki JEONG ,  Min-Young KIM ,  Seung-Jun LEE

IPC: G06K9/03

CPC classification number: G01B11/254 ,  G01B11/2513 ,  G01B11/2531 ,  G01N2021/95638 ,  G06K9/036

Abstract: A shape measurement apparatus includes a work stage supporting a target substrate, a pattern-projecting section including a light source, a grating part partially transmitting and blocking light generated by the light source to generate a grating image and a projecting lens part making the grating image on a measurement target of the target substrate, an image-capturing section capturing the grating image reflected by the measurement target of the target substrate, and a control section controlling the work stage, the pattern-projecting section and the image-capturing section, calculating a reliability index of the grating image and phases of the grating image, which is corresponding to the measurement target, and inspecting the measurement target by using the reliability index and the phases. Thus, the accuracy of measurement may be enhanced.

Abstract translation: 一种形状测量装置，包括支撑目标基板的工作台，包括光源的图案投影部分，部分地透射和遮挡由光源产生的光以产生光栅图像的光栅部分，以及使光栅图像产生的投影透镜部分 在目标基板的测量目标上，捕获由目标基板的测量目标反射的光栅图像的图像捕获部分，以及控制工作台，图案投影部分和图像捕获部分的控制部分，计算 光栅图像的可靠性指标和与测量对象对应的光栅图像的相位，并且通过使用可靠性指标和相位来检查测量对象。 因此，可以提高测量的精度。

公开(公告)号：US20130077849A1

公开(公告)日：2013-03-28

申请号：US13679390

申请日：2012-11-16

Applicant: KOH YOUNG TECHNOLOGY INC.

Inventor： Joong-Ki JEONG ,  Yu-Jin LEE ,  Seung-Jun LEE

IPC: G06K9/62

CPC classification number: G06T7/001 ,  G01B11/25 ,  G01B11/2531 ,  G06K9/6202 ,  G06T7/521

Abstract: An inspection method for inspecting a device mounted on a substrate, includes generating a shape template of the device, acquiring height information of each pixel by projecting grating pattern light onto the substrate through a projecting section, generating a contrast map corresponding to the height information of each pixel, and comparing the contrast map with the shape template. Thus, a measurement object may be exactly extracted.