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    IMAGING WITH ENHANCED X-RAY RADIATION
    1.
    发明申请
    IMAGING WITH ENHANCED X-RAY RADIATION 审中-公开

    公开(公告)号：US20180214093A1

    公开(公告)日：2018-08-02

    申请号：US15743304

    申请日：2016-07-12

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Gerhard MARTENS ,  Ewald ROESSL

    IPC: A61B6/06 ,  A61B6/00 ,  G21K1/02 ,  G21K1/06 ,  G02B27/09 ,  G01N23/20008 ,  G02B5/10

    Abstract: The invention relates to an X-ray imaging apparatus (2), comprising: a source (4) for generating X-ray radiation, an object receiving space (6) for arranging an object of interest for X-ray imaging, an X-ray collimator arrangement (8) arranged between the source (4) and the collimator arrangement (8), and an X-ray mirror arrangement (10). The mirror arrangement (10) comprises for example two tapered mirrors (22) facing each other and adapted for guiding X-ray radiation of the source (4) to the collimator arrangement (8). Consequently, the X-ray intensity at the object receiving space (6) is increased. In order to limit the X-ray radiation to an area, where the X-ray radiation can be utilized form imaging, an angle of spread Θm between the mirrors (22) and a length LM of each mirror (22) is adapted, such that a number of total reflections of X-ray radiation, provided by the source (4), at the mirrors (22) is limited. The limitation provides the effect that an angle of reflection Θr of the totally reflected X-ray radiation is limited. Consequently, an X-ray intensity at the object receiving space (6) is increased while constrains are provided, which prevent a large increase of a width of the X-ray radiation provided at the object receiving space (6), which effectively improves an imaging quality of an object of interest being arrangeable at the object receiving space (6).

    X-RAY APPARATUS
    7.
    发明申请
    X-RAY APPARATUS 有权
    X-RAY装置

    公开(公告)号：US20160157329A1

    公开(公告)日：2016-06-02

    申请号：US14428016

    申请日：2014-08-06

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Dominik Benjamin KUTRA ,  Thomas BUELOW ,  Gerhard MARTENS ,  Hanns-Ingo MAACK ,  Kirsten Regina MEETZ

    IPC: H05G1/30 ,  G21K1/02

    CPC classification number: H05G1/30 ,  G21K1/025

    Abstract: X-ray apparatus, with a collimator arrangement (12a, 18, 28a) positioned between the focus point (12b) and the detector (28b), mechanics (43) for enabling motion of the collimator arrangement, the detector and the x-ray source along a scan trajectory (30) in a x-z plane (83) and also along curved scan trajectory (45), which partly extents along a y-axis (35) perpendicular to the x-z plane. By using this invention better tissue coverage of objects with curved edges can be obtained.

    Abstract translation: 具有定位在聚焦点（12b）和检测器（28b）之间的准直器装置（12a，18,28a）的X射线设备，用于使得准直仪装置，检测器和x射线的运动的机构（43） 沿着xz平面（83）中的扫描轨迹（30）以及沿着垂直于xz平面的y轴（35）部分延伸的弯曲扫描轨迹（45）。 通过使用本发明，可以获得具有弯曲边缘的物体的更好的组织覆盖。

    CORRECTION IN SLIT-SCANNING PHASE CONTRAST IMAGING
    8.
    发明申请
    CORRECTION IN SLIT-SCANNING PHASE CONTRAST IMAGING 有权
    在扫描相位对比成像中的校正

    公开(公告)号：US20160128665A1

    公开(公告)日：2016-05-12

    申请号：US14896783

    申请日：2014-06-27

    Applicant: KONINKLIJKE PHILIPS N.V.

    Inventor： Ewald ROESSL ,  Gerhard MARTENS

    IPC: A61B6/00 ,  G01N23/20 ,  G21K1/10

    CPC classification number: A61B6/582 ,  A61B6/484 ,  A61B6/5258 ,  A61B6/583 ,  G01N23/20075 ,  G01N2223/303 ,  G02B5/1838 ,  G21K1/06 ,  G21K1/10 ,  G21K2207/005

    Abstract: The present invention relates to calibration in X-ray phase contrast imaging. In order to remove the disturbance due to individual gain factors, a calibration filter grating (10) for a slit-scanning X-ray phase contrast imaging arrangement is provided that comprises a first plurality of filter segments (11) comprising a filter material (12) and a second plurality of opening segments (13). The filter segments and the opening segments are arranged alternating as a filter pattern (15). The filter material is made from a material with structural elements (14) comprising structural parameters in the micrometer region. The filter grating is movably arranged between an X-ray source grating (54) and an analyzer grating (60) of an interferometer unit in a slit-scanning system of a phase contrast imaging arrangement. The slit-scanning system is provided with a pre-collimator (55) comprising a plurality of bars (57) and slits (59). The filter pattern is aligned with the pre-collimator pattern (61).

    Abstract translation: 本发明涉及X射线相位成像中的校准。 为了消除由于各种增益因素引起的干扰，提供了一种用于狭缝扫描X射线相位成像装置的校准滤光器光栅（10），其包括第一多个过滤器段（11），其包括过滤材料（12 ）和第二多个开口段（13）。 过滤器段和开口段作为过滤器图案交替排列（15）。 过滤材料由具有包括微米区域中的结构参数的结构元件（14）的材料制成。 滤光器光栅可移动地布置在相位成像装置的狭缝扫描系统中的干涉仪单元的X射线源光栅（54）和分析器光栅（60）之间。 狭缝扫描系统设置有包括多个杆（57）和狭缝（59）的预准直器（55）。 滤光片图案与预准直图案（61）对准。

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