公开(公告)号：US20020000983A1

公开(公告)日：2002-01-03

申请号：US09859577

申请日：2001-05-18

Applicant: LG. Philips LCD Co., Ltd.

Inventor： Gun Hee Lee ,  Wi Jin Nam

IPC: G09G003/36 ,  G09G005/00

CPC classification number: G02F1/1309 ,  G09G3/006

Abstract: A method for examining quality of a flat panel display device is disclosed, in which good/fail of the flat panel display device is automatically examined to improve efficiency of the operation and obtain exact examined result. The method for examining good/fail of a flat panel display device includes the steps of inputting defect data for each process step, automatically examining good/fail of the panel depending on the input defect data, and measuring good/fail and yield of a glass based on the examined result of the panel.

Abstract translation: 公开了一种用于检查平板显示装置的质量的方法，其中自动检查平板显示装置的良好/不良，以提高操作的效率并获得精确的检查结果。 用于检查平板显示装置的良好/失败的方法包括以下步骤：输入每个处理步骤的缺陷数据，根据输入的缺陷数据自动检查面板的良好/失败，以及测量玻璃的良好/失败和产量 根据小组的审查结果。