公开(公告)号：US20250148273A1

公开(公告)日：2025-05-08

申请号：US18926397

申请日：2024-10-25

Applicant: MEDIATEK INC.

Inventor： Khim Jun Koh ,  Chi-Ming Lee ,  Yi-Ju Ting ,  Chung-Kai Chang ,  Po-Chao Tsao ,  Chin-Wei Lin ,  Yu-Lin Yang ,  Tung-Hsing Lee ,  Chin-Tang Lai

IPC: G06N3/0499

Abstract: In an aspect of the disclosure, a method for detecting outlier integrated circuits on a wafer is provided. The method comprises: operating multiple test items for each IC on the wafer to generate measured values of the multiple test items for each IC; selecting a target IC and neighboring ICs on the wafer repeatedly. each time after selecting the target IC executes the following steps: selecting a measured value of the target IC as a target measured value and selecting measured values of the target IC and the neighboring ICs as feature values of the target IC and the neighboring ICs; executing a transformer deep learning model to generate a predicted value of the target measured value; and identifying outlier ICs according to the predicted values of all the target ICs and the corresponding target measured values of all the target ICs.

公开(公告)号：US20250148271A1

公开(公告)日：2025-05-08

申请号：US18915358

申请日：2024-10-15

Applicant: MEDIATEK INC.

Inventor： Yu-Lin Yang ,  Po-Chao Tsao ,  Hsiang-An Chen ,  Chin-Wei Lin ,  Ming-Cheng Lee ,  Tung-Hsing Lee

IPC: G06N3/0475

Abstract: An adaptive minimum voltage aging margin prediction method includes acquiring characteristic data of a plurality of dies in a testing line, predicting a wear-out failure rate of each module of the plurality of dies according to the characteristic data by using a neural network, and predicting a minimum voltage aging margin of the each module according to the wear-out failure rate of the each module by using the neural network.

公开(公告)号：US20240230755A9

公开(公告)日：2024-07-11

申请号：US18376447

申请日：2023-10-04

Applicant: MEDIATEK INC.

Inventor： Yu-Lin Yang ,  Chin-Wei Lin ,  Po-Chao Tsao ,  Tung-Hsing Lee ,  Chia-Jung Ni ,  Chi-Ming Lee ,  Yi-Ju Ting

IPC: G01R31/28 ,  G06N20/00

CPC classification number: G01R31/2894 ,  G06N20/00

Abstract: An outlier IC detection method includes acquiring first measured data of a first IC set, training the first measured data for establishing a training model, acquiring second measured data of a second IC set, generating predicted data of the second IC set by using the training model according to the second measured data, generating a bivariate dataset distribution of the second IC set according to the predicted data and the second measured data, acquiring a predetermined Mahalanobis distance on the bivariate dataset distribution of the second IC set, and identifying at least one outlier IC from the second IC set when at least one position of the at least one outlier IC on the bivariate dataset distribution is outside a range of the predetermined Mahalanobis distance.

公开(公告)号：US20240133949A1

公开(公告)日：2024-04-25

申请号：US18376447

申请日：2023-10-03

Applicant: MEDIATEK INC.

Inventor： Yu-Lin Yang ,  Chin-Wei Lin ,  Po-Chao Tsao ,  Tung-Hsing Lee ,  Chia-Jung Ni ,  Chi-Ming Lee ,  Yi-Ju Ting

IPC: G01R31/28 ,  G06N20/00

CPC classification number: G01R31/2894 ,  G06N20/00

Abstract: An outlier IC detection method includes acquiring first measured data of a first IC set, training the first measured data for establishing a training model, acquiring second measured data of a second IC set, generating predicted data of the second IC set by using the training model according to the second measured data, generating a bivariate dataset distribution of the second IC set according to the predicted data and the second measured data, acquiring a predetermined Mahalanobis distance on the bivariate dataset distribution of the second IC set, and identifying at least one outlier IC from the second IC set when at least one position of the at least one outlier IC on the bivariate dataset distribution is outside a range of the predetermined Mahalanobis distance.