公开(公告)号：US20250147073A1

公开(公告)日：2025-05-08

申请号：US18934482

申请日：2024-11-01

Applicant: MPI Corporation

Inventor： CHIEN-MING LO ,  Hsuan-Ti Yeh ,  Chih-Hao Ho ,  Horng-Chuan Sun ,  Chien-Ming Huang ,  Chia-Hung Liu

IPC: G01R1/073 ,  G01R3/00

Abstract: The present invention provides a probe card. The probe card comprises a circuit board, a cantilever-type space transformer electrically connected to the circuit board, and a vertical probe head electrically connected to the cantilever-type space transformer. The vertical probe head comprises a probe base and a plurality of vertical probes. The cantilever-type space transformer comprises a mounting base and a plurality of cantilever converting probes, wherein each cantilever converting probe has a fixed segment and an exposed segment. The fixed segment is secured to the mounting base, and the exposed segment is located outside the mounting base. The fixing segment enters from the side of the mounting base and forms a contact at the bottom of the mounting base.