中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

89 records (took 0.05 seconds)

    Independent suspension system for a leaning vehicle
    1.
    发明授权
    Independent suspension system for a leaning vehicle 有权

    公开(公告)号：US11602967B2

    公开(公告)日：2023-03-14

    申请号：US17243093

    申请日：2021-04-28

    Applicant: Mark Wagner

    Inventor： Mark Wagner

    IPC: B60G3/20 ,  B60G3/26 ,  B62K5/01 ,  B62K5/08 ,  B62K5/10

    Abstract: A suspension for a leaning vehicle having a central frame, the central frame having a first longitudinal axis. The suspension includes a carrier assembly pivotably attached about a second longitudinal axis to the frame, the carrier assembly including a carrier body; a first spring and damper assembly pivotably mounted to a first side of the carrier body at a first end thereof; a second spring and damper assembly pivotably mounted to a second side of the carrier body at a first end thereof; a first bellcrank pivotably mounted to a first side of the carrier body at a second end thereof, the second end of the first spring and damper assembly also mounted to the first bellcrank; and a second bellcrank pivotably mounted to a second side of the carrier body at a second end thereof, the second end of the second spring and damper assembly also mounted to the second bellcrank; wherein the first and second bellcranks are pivoted about their attaching axes when the spring and damper assemblies are compressed; a pair of first upper connecting components; a pair of first lower connecting components; and a first suspension travel link and a second suspension travel link.

    SIGNAGE SYSTEM
    2.
    发明申请
    SIGNAGE SYSTEM 审中-公开

    公开(公告)号：US20170365200A1

    公开(公告)日：2017-12-21

    申请号：US15477718

    申请日：2017-04-03

    Applicant: Mark Wagner

    Inventor： Mark Wagner

    IPC: G09F21/04 ,  G09F13/22 ,  G09F9/33 ,  G01J1/42 ,  G09F13/00 ,  H05B33/08 ,  G09F7/18

    CPC classification number: G09F21/04 ,  G01J1/42 ,  G09F7/18 ,  G09F9/33 ,  G09F13/005 ,  G09F13/22 ,  G09F21/048 ,  G09F2007/1852 ,  G09F2013/222 ,  H05B33/08

    Abstract: A signage system (10) including one or more visual display devices (11), each mounted for display behind the windshield (15) of one or more parked and ignition-off vehicles (16). Each sign (11) has a visual display surface (12) that is capable of forming an illuminated graphic display (13) on the visual display surface (12). The visual display surface (12) would be visible to observers in front of the vehicle (16). The system (10) includes wireless communication hardware (60) that allows the visual display (11) to be programmed by a remote programming device (41). Each of the display devices (11) can be programmed to have a separate message and each message would scroll from left to right across the display surface (12) in a time coordinated manner so that the message appears to scroll consistently from left to right across the visual field of the plurality of display surfaces (12).

    System for detection of wafer defects
    4.
    发明授权
    System for detection of wafer defects 有权
    晶圆缺陷检测系统

    公开(公告)号：US07961763B2

    公开(公告)日：2011-06-14

    申请号：US11476342

    申请日：2006-06-28

    Applicant: Dov Furman ,  Gad Neumann ,  Mark Wagner ,  Noam Dotan ,  Ram Segal ,  Shai Silberstein

    Inventor： Dov Furman ,  Gad Neumann ,  Mark Wagner ,  Noam Dotan ,  Ram Segal ,  Shai Silberstein

    IPC: H01S3/10 ,  H01S3/11 ,  H01S3/0915

    CPC classification number: G01N21/9501 ,  G01N21/8806 ,  G01N21/95607 ,  G01N21/95623 ,  G01N2021/479 ,  G01N2021/8825 ,  G01N2201/0697 ,  G01N2201/0826

    Abstract: Fast on-line electro-optical detection of wafer defects by illuminating with a short light pulse from a repetitively pulsed laser, a section of the wafer while it is moved across the field of view of an imaging system, and imaging the moving wafer onto a focal plane assembly, optically forming a continuous surface of photo-detectors at the focal plane of the optical imaging system. The continuously moving wafer is illuminated by a laser pulse of duration significantly shorter than the pixel dwell time, such that there is effectively no image smear during the wafer motion. The laser pulse has sufficient energy and brightness to impart the necessary illumination to each sequentially inspected field of view required for creating an image of the inspected wafer die. A novel fiber optical illumination delivery system, which is effective in reducing the effects of source coherence is described. Other novel aspects of the system include a system for compensating for variations in the pulse energy of a Q-switched laser output, methods for autofocussing of the wafer imaging system, and novel methods for removal of repetitive features of the image by means of Fourier plane filtering, to enable easier detection of wafer defects.

    Abstract translation: 通过用来自重复脉冲激光器的短光脉冲照射晶片缺陷的快速在线电光检测，晶片的一部分在成像系统的视场内移动，并将移动的晶片成像到 焦平面组件，在光学成像系统的焦平面处光学地形成光电检测器的连续表面。 持续移动的晶片被持续时间明显短于像素停留时间的激光脉冲照亮，使得在晶片运动期间实际上没有图像污迹。 激光脉冲具有足够的能量和亮度，以对于产生被检查的晶片管芯的图像所需的每个顺序检查的视场赋予必要的照明。 描述了一种有效减少源相干效应的新型光纤照明传输系统。 该系统的其他新颖的方面包括用于补偿Q开关激光输出的脉冲能量变化的系统，用于晶片成像系统的自动聚焦的方法，以及通过傅立叶平面去除图像的重复特征的新颖方法 过滤，以便更容易地检测晶片缺陷。

    Compositions and methods for image development of conventional chemically amplified photoresists
    7.
    发明授权
    Compositions and methods for image development of conventional chemically amplified photoresists 失效
    用于常规化学放大光致抗蚀剂的图像显影的组合物和方法

    公开(公告)号：US07410751B2

    公开(公告)日：2008-08-12

    申请号：US11045791

    申请日：2005-01-28

    Applicant: James DeYoung ,  Mark Wagner

    Inventor： James DeYoung ,  Mark Wagner

    IPC: G03C5/18

    CPC classification number: G03F7/322 ,  G03F7/32 ,  G03F7/325 ,  G03F7/36 ,  Y10T428/12486

    Abstract: Methods for carrying out lithography with a carbon dioxide development system are described. In some embodiments the methods involve preferential removal of a darkfield region; in other embodiments the methds involve preferential removal of a light field region. The carbon dioxide development systems include a quaternary ammonium salt, preferably a quaternary ammonium hydroxide, halide, or carbonate. Compositions for carrying out the methods are also described. The quaternary ammonium salts preferably contain at least one CO2-philic group, such as a siloxane-containing group or a fluorine-containing group.

    Abstract translation: 描述了用二氧化碳显影系统进行光刻的方法。 在一些实施方案中，所述方法涉及优先去除暗区域; 在其他实施例中，方法涉及优先去除光场区域。 二氧化碳显影系统包括季铵盐，优选季铵氢氧化物，卤化物或碳酸盐。 还描述了用于实施方法的组合物。 季铵盐优选含有至少一个CO 2 - 二亲基团，例如含硅氧烷基团或含氟基团。

Patent Agency Ranking