SYSTEM FOR CHARACTERIZING A TRANSISTOR CIRCUIT

    公开(公告)号:US20240159820A1

    公开(公告)日:2024-05-16

    申请号:US18500249

    申请日:2023-11-02

    CPC classification number: G01R31/2837 G01R31/287

    Abstract: A system for characterizing a transistor circuit which has a local minimum in its transfer characteristic by finding its local minimum. The system comprises: a bias voltage generator for generating a toggling signal; a multiplier configured for multiplying an electrical signal which is a function of the drain source current of the transistor circuit, with a waveform alternating between two predefined values synchronously with the toggling signal; a first integrator configured for integrating the electrical signal from the multiplier, and wherein if more integrators are present, linear combinations of output signals of the integrators are provided to the further integrators; a summator configured for summing the toggling signal and an integration signal and configured for outputting the sum to the gate of the transistor circuit.

    DEVICE AND METHOD FOR ABSOLUTE VOLTAGE MEASUREMENT

    公开(公告)号:US20200099384A1

    公开(公告)日:2020-03-26

    申请号:US16577822

    申请日:2019-09-20

    Abstract: A method and a circuit for measuring an absolute voltage signal, such that the circuit comprises: an A/D convertor, and a controller adapted for: a) obtaining a first digital reference value for a first reference signal having a positive temperature coefficient; b) obtaining a second digital reference value for a second reference signal having a negative temperature coefficient; c) obtaining a raw digital signal value for the signal to be measured, while applying a same reference voltage for step a) to c); and d) calculating the absolute voltage value in the digital domain using a mathematical function of the first and second digital reference value, and the raw digital signal value.

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