公开(公告)号：US20240361159A1

公开(公告)日：2024-10-31

申请号：US18684804

申请日：2021-10-06

Applicant: NEUBREX CO., LTD.

Inventor： Kinzo KISHIDA ,  Yahei KOYAMADA ,  Kenichi NISHIGUCHI ,  Daiji AZUMA ,  Che-Hsien LI

IPC: G01D5/353

CPC classification number: G01D5/35361

Abstract: A Rayleigh intensity pattern measurement device includes: a tunable-wavelength LD (1); an optical coupler; a reception unit which receives coherent light from the tunable-wavelength LD and the Rayleigh scattering light; and an RIP digital processing unit which receives an output signal from the reception unit by an A/D converter, calculates a cross-correlation coefficient from two different Rayleigh intensity pattern signals obtained from the Rayleigh scattering light, and stores a cross-correlation coefficient obtained from a result of comparison with a given threshold. If the compared cross-correlation coefficient is smaller than the threshold, the cross-correlation coefficient is calculated until becoming equal to or greater than the threshold, and Rayleigh frequency shift is calculated from the cross-correlation coefficient that has become equal to or greater than the threshold, whereby a strain distribution or a temperature distribution of a measurement target is measured.