公开(公告)号：US5749049A

公开(公告)日：1998-05-05

申请号：US18132

申请日：1993-02-16

Applicant: Nicholas Jacob Worp

Inventor： Nicholas Jacob Worp

IPC: H04B5/00 ,  H05K1/00 ,  H05K1/02 ,  H05K1/16 ,  H04B17/00

CPC classification number: H04B5/04 ,  H04B5/0012 ,  H05K1/162 ,  H05K1/0268 ,  H05K1/0298 ,  H05K2201/09672

Abstract: An electronic device includes a substrate (200) for supporting electrical circuits (202), the substrate (200) including first and second opposing surface areas (204 and 206). At least first and second electrical contacts (214 and 216) are disposed on the substrate 200 and are electrically coupled to at least first and second conductive plates (210 and 212), respectively. The first and second conductive plates (210 and 212) are disposed on the first and second opposing surface areas (204 and 206) of the substrate (200), respectively. Preferably, the first and second conductive plates (210 and 212) at least partially overlap with each other. The first and second conductive plates (210 and 212) form a capacitive element therebetween for determining excessive variability in composition of the substrate as indicated by a measured inherent capacitance of the substrate at the capacitive element that is outside a specified tolerance of the capacitive element (200).

Abstract translation: 电子设备包括用于支撑电路（202）的基板（200），所述基板（200）包括第一和第二相对表面区域（204和206）。 至少第一和第二电触头（214和216）分别设置在基板200上并分别电耦合到至少第一和第二导电板（210和212）。 第一和第二导电板（210和212）分别设置在基板（200）的第一和第二相对表面区域（204和206）上。 优选地，第一和第二导电板（210和212）至少部分地彼此重叠。 第一和第二导电板（210和212）在其间形成电容元件，用于确定衬底的组成的过度变化，如电容元件处的衬底在电容元件的规定公差之外的测量的固有电容所示（ 200）。