公开(公告)号：US20190331526A1

公开(公告)日：2019-10-31

申请号：US16319477

申请日：2017-08-03

Applicant: OPHIR OPTRONICS SOLUTIONS LTD.

Inventor： Efi ROTEM ,  Raphael COHEN ,  Shimon ELSTEIN ,  Mark IVKER ,  Eliyahu BENDER ,  Daniel SEBBAG ,  Ilan HABER

IPC: G01J1/42 ,  G01J1/02 ,  G01J1/04

Abstract: A photometric test system for LED luminaires. The system uses photodetective panels to detect and measure light. By placing an optical absorber layer with low reflectivity and low transmissivity over the photodetective panels, a detection surface which is also an absorber is achieved. This absorber reduces reflection of incident light from the device under test (DUT), and light reflected from the photodetective panels. A pinhole array can be conveniently used for this purpose. This enables the measurement area of the system to be essentially no larger than the emitting area of the DUT. A diffuser positioned between the absorber layer and the photodetective panels increases the accuracy of the system. Simulations and experimental results show that this system can measure total flux with an uncertainty of 4.3%. The demonstrated system is used in 2π geometry. The system measures total flux, color parameters (such as CCT, CRI, chromaticity) and flicker.