公开(公告)号：US20240112325A1

公开(公告)日：2024-04-04

申请号：US18273269

申请日：2022-02-21

Applicant: Orbotech Ltd.

Inventor： Gonen RAVEH

IPC: G06T7/00

CPC classification number: G06T7/001 ,  G06T2207/20081 ,  G06T2207/20084 ,  G06T2207/30141

Abstract: A method, product and system for Automatic Optical Inspection (AOI) using hybrid imaging system, The method comprises obtaining a prediction model that is configured to predict enhanced-quality images of products based on a low-quality images of the products, wherein the prediction model is generated based images obtained by a dual-scanning system comprising a low-quality scanning system and a high-quality scanning system. Based on a low-quality image of the product that is captured using the low-quality scanning system and using the prediction model, an enhanced-quality image of the product is predicted and utilized for defects detection.