公开(公告)号：US20150118767A1

公开(公告)日：2015-04-30

申请号：US14586737

申请日：2014-12-30

Applicant: PANASONIC CORPORATION

Inventor： Kazushi SUGIYAMA ,  Miki FUKUSHIMA ,  Yuki IMAI ,  Yasunori NEGORO

IPC: H01L51/00 ,  H01L27/32

CPC classification number: H01L51/0031 ,  G01J3/506 ,  G01J2001/4247 ,  G09G3/006 ,  G09G3/32 ,  G09G2320/0693 ,  H01L27/3244 ,  H05B33/10

Abstract: A method of manufacturing an EL display device having a light emitting part, in which a plurality of pixels are arrayed, and a thin-film transistor array device to control light emission of the light emitting part, includes a luminance measurement step of obtaining luminance data of pixel, with the light emitting part being lit. The luminance measurement step includes a first luminance measurement step and a second luminance measurement step. In the first luminance measurement step, a first imaging apparatus obtains luminance data by measuring light emission of the each pixel. The first apparatus has a resolution corresponding to that of the pixels of the light emitting part. In the second luminance measurement step after the first step, a second imaging apparatus measures light emission of a plurality of the pixels to correct the luminance data of the each pixel obtained in the first luminance measurement step. The second imaging apparatus is lower in resolution than the first imaging apparatus.

Abstract translation: 一种制造具有其中排列有多个像素的发光部分的EL显示装置的方法和用于控制发光部分的发光的薄膜晶体管阵列装置，包括获得亮度数据的亮度测量步骤 的像素，发光部分被点亮。 亮度测量步骤包括第一亮度测量步骤和第二亮度测量步骤。 在第一亮度测量步骤中，第一成像设备通过测量每个像素的发光来获得亮度数据。 第一装置具有与发光部分的像素相对应的分辨率。 在第一步骤之后的第二亮度测量步骤中，第二成像设备测量多个像素的发光，以校正在第一亮度测量步骤中获得的每个像素的亮度数据。 第二成像装置的分辨率低于第一成像装置。