公开(公告)号：US12072188B2

公开(公告)日：2024-08-27

申请号：US17605946

申请日：2020-04-16

Applicant: PANTECH CORPORATION

Inventor： Xin Yuan ,  Paul Wilford ,  Mu Qiao ,  Xuan Liu

IPC: G01B9/02091 ,  G01B9/02015 ,  G01J3/02 ,  G01B9/02004

CPC classification number: G01B9/02091 ,  G01B9/02027 ,  G01B9/0203 ,  G01J3/0224 ,  G01J3/0229 ,  G01B9/02004 ,  G01B2290/20 ,  G01B2290/70

Abstract: An apparatus comprising: a double path interferometer comprising a sample path for an object and a reference path; a source of linearly polarized light for the double path interferometer, a phase plate positioned in the sample path; means for superposing the sample path and reference path to create a beam of light for detection; means for spatially modulating the beam of light to produce a modulated beam of light; means for dispersing the modulated beam of light to produce a spatially modulated and dispersed beam of light; a first detector; a second detector, and means for splitting the spatially modulated and dispersed beam of light, wherein light of a first linear polarization is directed to the first detector and light of a second linear polarization, orthogonal to the first linear polarization, is directed to the second detector.