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1.Method and device for measuring thicknesses with penetrating rays 失效
Title translation: 用穿透光线测量厚度的方法和装置公开(公告)号:US2057325A
公开(公告)日:1936-10-13
申请号:US58622432
申请日:1932-01-12
Applicant: PHILIPS NV
Inventor: ALBERT BOUWERS , HONDIUS BOLDINGH WILLEM
IPC: G01B15/02
CPC classification number: G01B15/025
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公开(公告)号:US1933652A
公开(公告)日:1933-11-07
申请号:US41671029
申请日:1929-12-26
Applicant: PHILIPS NV
Inventor: HONDIUS BOLDINGH WILLEM
IPC: G03B42/04
CPC classification number: G03B42/04
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公开(公告)号:US2051411A
公开(公告)日:1936-08-18
申请号:US59212032
申请日:1932-02-10
Applicant: PHILIPS NV
Inventor: ALFRED KUNTKE , HONDIUS BOLDINGH WILLEM
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公开(公告)号:US1917090A
公开(公告)日:1933-07-04
申请号:US56909031
申请日:1931-10-15
Applicant: PHILIPS NV
Inventor: ALBERT BOUWERS , HONDIUS BOLDINGH WILLEM
IPC: H05G1/04
CPC classification number: H05G1/04
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公开(公告)号:US2054493A
公开(公告)日:1936-09-15
申请号:US65353833
申请日:1933-01-25
Applicant: PHILIPS NV
Inventor: ALBERT BOUWERS , HONDIUS BOLDINGH WILLEM
IPC: H05G1/36
CPC classification number: H05G1/36
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