公开(公告)号：US20230177655A1

公开(公告)日：2023-06-08

申请号：US17924271

申请日：2021-05-12

Applicant: PXE COMPUTATIONAL IMAGING LTD.

Inventor： Yoav Berlatzky ,  Yanir Hainick

IPC: G06T5/00 ,  G01J9/00 ,  G06T7/00

CPC classification number: G06T5/003 ,  G01J9/00 ,  G06T7/0002 ,  G06T5/006 ,  G06T2207/30168 ,  G06T2207/10024 ,  H04N23/55

Abstract: There are provided systems and methods for digital optical aberration correction and spectral imaging. An optical system may comprise an optical imaging unit, to form an optical image near an image plane of the optical system; a wavefront imaging sensor unit located near the image plane, to provide raw digital data on an optical field and image output near the image plane; and a control unit for processing the raw digital data and the image output to provide deblurred image output, wherein the control unit comprises a storage unit that stores instructions and a processing unit to execute the instructions to receive the image input and the raw digital data of the optical field impinging on the wavefront imaging sensor and generate a deblurred image based on an analysis of the optical mutual coherence function at the imaging plane.

公开(公告)号：US20230029930A1

公开(公告)日：2023-02-02

申请号：US17792270

申请日：2021-01-13

Applicant: PXE Computational Imaging LTD.

Inventor： Yoav Berlatzky ,  Yanir Hainick

IPC: G01B11/16 ,  H04N5/225 ,  H04N5/235 ,  G06V40/16 ,  G06V10/25 ,  G06V10/26

Abstract: There are provided systems and methods for imaging, measuring an object, and characterizing a sample. An optical, speckle-based imaging system may comprise an illumination unit comprising at least one coherent light source to illuminate a sample; a collection unit for collecting input light from the sample, the collection unit consisting of an imaging optics and a wavefront imaging sensor; and a control unit coupled to the illumination unit and the collection unit for analyzing the input light and generating a speckle wavefront image, wherein the at least one coherent light source is to generate primary speckles in the sample or thereon, and the imaging optics is to capture a secondary speckle pattern induced by the illumination unit in the sample or thereon.