公开(公告)号：US20130027563A1

公开(公告)日：2013-01-31

申请号：US13560077

申请日：2012-07-27

Applicant: Pascal MELLOT

Inventor： Pascal MELLOT

IPC: H04N17/00

CPC classification number: H04N5/376 ,  H04N5/367 ,  H04N17/002

Abstract: A method is for monitoring the electrical integrity of lines of photosites of an imaging device with matrix array of photosites. The control lines of photosites may include for each line of photosites an emission of elementary electrical control signals for the photosites of the line. The method may include diagnosis of the elementary electrical control signals emitted.

Abstract translation: 一种用于监测具有矩阵矩阵阵列的成像装置的光斑线的电气完整性的方法。 光线的控制线可以包括针对每一行的光线发射线的光电子元件的基本电控制信号。 该方法可以包括对发出的基本电气控制信号的诊断。