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公开(公告)号：US12272118B2
公开(公告)日：2025-04-08
申请号：US17880721
申请日：2022-08-04
Applicant: Peratech IP Ltd.
Inventor： Timothy Peter Wiles
IPC: G06V10/764 , G06V10/75 , G06V10/77 , G06V10/82
Abstract: A method of classifying pressure inputs in a sensing array, in which the sensing array comprises a plurality of sensing elements responsive to pressure inputs is described. The method comprises steps of identifying a plurality of pressure inputs in the sensing array and converting the plurality of pressure inputs into an output image. The output image is compared with a data set comprising a plurality of images of undesirable pressure inputs by means of an artificial neural network. A mask is applied which is consistent with the output image to remove undesirable pressure inputs.
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公开(公告)号：US20250012648A1
公开(公告)日：2025-01-09
申请号：US18887261
申请日：2024-09-17
Applicant: Peratech IP Ltd.
Inventor： Daniel WHITING , Timothy Peter Wiles
Abstract: A force sensing device comprises a first electrode and a second electrode arranged to provide an electrical output in response to an applied force to determine the magnitude of the applied force. The force sensing device comprises a collapsible structure configured to provide an electrical short circuit in response to the applied force when the applied force exceeds a predetermined magnitude.
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公开(公告)号：US12158386B2
公开(公告)日：2024-12-03
申请号：US17553905
申请日：2021-12-17
Applicant: PERATECH IP LTD
Inventor： Timothy Peter Wiles
Abstract: A method of calibrating a force sensing device comprises establishing an optimized force-resistance curve by obtaining a mean resistance of a plurality of force-resistance curves for a set of substantially similar force sensing devices and measuring calibration data of the force sensing device. The method applies a plurality of calibration points defined from the measuring step to the optimized force-resistance curve and adapts the optimized force-resistance curve to form an adapted force-resistance curve by interpolating the plurality of calibration points and determining a multiplier value for each calibration point.
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