FINGERPRINT IDENTIFICATION MODULE TEST SYSTEM

    公开(公告)号:US20190318464A1

    公开(公告)日:2019-10-17

    申请号:US15990115

    申请日:2018-05-25

    Abstract: A fingerprint identification module test system includes a light source, a projection surface, a low-end image pickup device and a judgment module. The light source emits and projects a light beam onto an under-test fingerprint identification module. After the light beam is reflected by the under-test fingerprint identification module and projected onto the projection surface, a projected image is formed on the projection surface. Then, the low-end image pickup device photographs the projected image to acquire an under-test corresponding to the under-test fingerprint identification module. According to the result of comparing the under-test image with the predetermined image, the judgment module judges whether the under-test fingerprint identification module complies with the production specifications. Since the fingerprint identification module test system uses parity devices to test the under-test fingerprint identification module, the fingerprint identification module test system is cost-effective.

    IMAGE FOCUSING METHOD AND IMAGE PICKUP DEVICE USING THE SAME

    公开(公告)号:US20170155819A1

    公开(公告)日:2017-06-01

    申请号:US15047420

    申请日:2016-02-18

    Inventor: JUI-TING CHIEN

    CPC classification number: H04N5/23212 G02B7/36 G03B13/36

    Abstract: An image focusing method and an image pickup device using the image focusing method are provided. The image focusing method includes following steps. Firstly, an image is captured. Then, the plural first incident light pixels of the image are collected as a first pattern, and plural second incident light pixels of the image as a second pattern. The first pattern has a first block corresponding to a focusing area of the image. The second pattern has a second block corresponding to the focusing area of the image. Then, a phase difference between the first block and the second block and phase differences between the first block and plural test block are obtained. The test blocks are partially overlapped with the second block or located near the second block. Afterwards, a lens module is moved according to the lowest phase difference.

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