公开(公告)号：US11537822B2

公开(公告)日：2022-12-27

申请号：US16420100

申请日：2019-05-22

Applicant: RAYTHEON BBN TECHNOLOGIES CORP.

Inventor： Kin Chung Fong ,  Man-Hung Siu ,  Zhuolin Jiang

IPC: G06V10/82 ,  G06K9/62 ,  G06N3/04 ,  C01B32/19

Abstract: A method for classifying images of oligolayer exfoliation attempts. In some embodiments, the method includes forming a micrograph of a surface, and classifying the micrograph into one of a plurality of categories. The categories may include a first category, consisting of micrographs including at least one oligolayer flake, and a second category, consisting of micrographs including no oligolayer flakes, the classifying comprising classifying the micrograph with a neural network.

公开(公告)号：US20230091882A1

公开(公告)日：2023-03-23

申请号：US17992815

申请日：2022-11-22

Applicant: RAYTHEON BBN TECHNOLOGIES CORP.

Inventor： Kin Chung Fong ,  Man-Hung Siu ,  Zhuolin Jiang

IPC: G06K9/62 ,  G06N3/04 ,  C01B32/19 ,  G06V10/82

Abstract: A method for classifying images of oligolayer exfoliation attempts. In some embodiments, the method includes forming a micrograph of a surface, and classifying the micrograph into one of a plurality of categories. The categories may include a first category, consisting of micrographs including at least one oligolayer flake, and a second category, consisting of micrographs including no oligolayer flakes, the classifying comprising classifying the micrograph with a neural network.

公开(公告)号：US11721095B2

公开(公告)日：2023-08-08

申请号：US17992815

申请日：2022-11-22

Applicant: RAYTHEON BBN TECHNOLOGIES CORP.

Inventor： Kin Chung Fong ,  Man-Hung Siu ,  Zhuolin Jiang

IPC: G06V10/82 ,  G06N3/04 ,  C01B32/19 ,  G06F18/24 ,  G06V20/69

CPC classification number: G06V10/82 ,  C01B32/19 ,  G06F18/24 ,  G06N3/0418 ,  G06V20/698

Abstract: A method for classifying images of oligolayer exfoliation attempts. In some embodiments, the method includes forming a micrograph of a surface, and classifying the micrograph into one of a plurality of categories. The categories may include a first category, consisting of micrographs including at least one oligolayer flake, and a second category, consisting of micrographs including no oligolayer flakes, the classifying comprising classifying the micrograph with a neural network.