公开(公告)号：US20200276669A1

公开(公告)日：2020-09-03

申请号：US16759182

申请日：2018-11-07

Applicant: RENISHAW PLC

Inventor： John DARDIS ,  Kiera Megan JONES ,  Ceri BROWN ,  Nicholas Henry Hannaford JONES

IPC: B23K26/342 ,  B33Y10/00 ,  B33Y50/00

Abstract: A method of generating a spatial map of sensor data collected during additive manufacturing, in which a plurality of layers of powder are selectively melted with an energy beam to form an object. The method includes receiving sensor data collected during additive manufacturing of an object, the sensor data including sensor values, the sensor values captured for different coordinate locations of the energy beam during the additive manufacturing of the object, and generating cell values for a corresponding cell-based spatial mapping of the sensor data. Each of the cell values is determined from a respective plurality of the sensor values extending over an area/volume comparable to an extent of the melt pool or the energy beam spot.

公开(公告)号：US20200262152A1

公开(公告)日：2020-08-20

申请号：US16760014

申请日：2018-11-07

Applicant: RENISHAW PLC

Inventor： John DARDIS ,  James Stephen GARRARD ,  Callum HEALEY

IPC: B29C64/393 ,  B33Y30/00 ,  B33Y50/02 ,  B29C64/268 ,  B29C64/286

Abstract: A laser solidification apparatus for building objects by layerwise solidification of material. The laser solidification apparatus includes a build platform for supporting the object and a material bed, an optical module including a movable guiding element for directing the laser beam to solidify material of the material bed, and a detector module including a sensor for detecting radiation emitted from the material bed and transmitted to the sensor by the movable guiding element of the optical module. The detector module is removably mounted to the optical module.

公开(公告)号：US20190283332A1

公开(公告)日：2019-09-19

申请号：US16341246

申请日：2017-11-10

Applicant: RENISHAW PLC

Inventor： Ceri BROWN ,  John DARDIS ,  Allan Christopher NORMAN

IPC: B29C64/393 ,  B33Y30/00 ,  B33Y50/02 ,  B29C64/20 ,  G01B11/00

Abstract: A method of monitoring an additive manufacturing process, in which an object is built in a layer-by-layer manner by directing a laser beam using at least one movable guiding element of a scanner to solidify selected regions of a material bed. The method includes recording position values generated from a transducer measuring positions of the at least one movable guiding element, recording sensor values generated from a sensor for detecting radiation emitted from the material bed and transmitted to the sensor by the movable guiding element of the scanner, and associating each sensor value with a corresponding one of the position values.

公开(公告)号：US20230302538A1

公开(公告)日：2023-09-28

申请号：US18008601

申请日：2021-07-05

Applicant: RENISHAW PLC

Inventor： David Roberts MCMURTRY ,  John DARDIS

IPC: B22F10/31 ,  B22F10/28 ,  B22F12/45 ,  B29C64/268 ,  B29C64/386

CPC classification number: B22F10/31 ,  B22F10/28 ,  B22F12/45 ,  B29C64/268 ,  B29C64/386

Abstract: A method and apparatus for determining an alignment of an optical scanner for directing an electromagnetic beam to locations within a scan field. The method may include locating a reference element within the scan field of the optical scanner and controlling the optical scanner to cause the electromagnetic beam to be directed to a plurality of different points in the scan field, including at least one point on the reference element. Reflected electromagnetic radiation is detected. The method may include determining when the electromagnetic beam is directed to a reference position in the scan field given by the reference element from a comparison of an intensity of the detected electromagnetic radiation for the different points and determining a corresponding demand signal that causes the optical scanner to direct the electromagnetic beam to the reference position.

公开(公告)号：US20220168813A1

公开(公告)日：2022-06-02

申请号：US17434311

申请日：2020-02-26

Applicant: RENISHAW PLC

Inventor： John DARDIS ,  Ceri BROWN ,  Jonathan MANSELL

IPC: B22F10/366 ,  B22F10/28 ,  B22F12/49 ,  B22F12/45 ,  B22F12/47 ,  B22F10/85 ,  B33Y50/02 ,  B33Y30/00 ,  B33Y10/00

Abstract: A method of aligning an on-axis melt pool sensor in an additive manufacturing apparatus. The method includes scanning a first laser beam along a first scan path across a working surface using a first optical train to generate a melt pool along the first scan path and scanning a field of view of an on-axis sensor along a second scan path across the working surface using a second optical train for steering a second laser beam. The first and second scan paths intersect. An adjustment to be made to an alignment of the field of view of the on-axis sensor with an optical axis of the second optical train is determined from a variation in the signal generated by the on-axis sensor as the field of view is scanned along the second scan path.

公开(公告)号：US20150369637A1

公开(公告)日：2015-12-24

申请号：US14654952

申请日：2014-01-13

Applicant: RENISHAW PLC

Inventor： Matthew Donald KIDD ,  Nicholas John WESTON ,  James Reynolds HENSHAW ,  Marcus ARDRON ,  John DARDIS ,  Robert THOMSON

IPC: G01D5/34 ,  B23K26/362

CPC classification number: G01D5/345 ,  B23K26/361 ,  B23K26/362 ,  B82Y20/00 ,  G01D5/344

Abstract: A measurement scale device includes at least one scale marking, wherein the or each scale marking includes at least one periodic nanostructure that represents scale device information.

Abstract translation: 测量标尺装置包括至少一个刻度标记，其中所述或每个刻度标记包括表示尺度装置信息的至少一个周期性纳米结构。

公开(公告)号：US20150339505A1

公开(公告)日：2015-11-26

申请号：US14654971

申请日：2014-01-13

Applicant: RENISHAW PLC

Inventor： Matthew Donald KIDD ,  Nicholas John WESTON ,  James Reynolds HENSHAW ,  Marcus ARDRON ,  John DARDIS ,  Robert THOMSON

IPC: G06K7/10

CPC classification number: G06K7/10821 ,  G01D5/345

Abstract: A method of reading data represented by a marking including at least one periodic nanostructure, the marking representing data using a polarisation property of the periodic nanostructure. The method includes detecting polarised electromagnetic radiation reflected from or transmitted by the nanostructure, and determining the data represented by the marking from the detected polarised electromagnetic radiation, wherein the method further includes applying polarised electromagnetic radiation to the nanostructure, and/or the detecting is performed using a polarisation-sensitive detector apparatus.

Abstract translation: 一种读取由包括至少一个周期性纳米结构的标记表示的数据的方法，该标记表示使用周期性纳米结构的极化性质的数据。 该方法包括检测从纳米结构反射或透射的极化电磁辐射，以及从检测到的偏振电磁辐射确定由标记表示的数据，其中所述方法还包括向纳米结构施加极化电磁辐射和/或执行检测 使用偏振敏感检测器装置。