公开(公告)号：US20250146943A1

公开(公告)日：2025-05-08

申请号：US18838745

申请日：2023-03-01

Applicant: RENISHAW PLC

Inventor： Timothy BATTEN ,  Ian Sean BENNELL

IPC: G01N21/65 ,  H01J37/02 ,  H01J37/22

Abstract: A probe for use with a sample chamber, the probe including a probing element mounted on an arm, the arm insertable or inserted into the sample chamber to locate the probing element within the sample chamber, a drive mechanism for moving the arm, and a drive control system. Movement of the arm causes movement of the probing element within the sample chamber. The drive control system is for limiting movement of the arm to a specified range, the drive control system programmable to adjust the specified range.