公开(公告)号：US20140252233A1

公开(公告)日：2014-09-11

申请号：US14281315

申请日：2014-05-19

Applicant: Rare Light, Inc.

Inventor： Robert G. Messerchmidt

IPC: G01N21/55

CPC classification number: G01N21/552 ,  G01N21/43 ,  G01N2201/0221

Abstract: Spectroscopy apparatuses oriented to the critical angle of the sample are described that detecting the spectral characteristics of a sample wherein the apparatus consists of an electromagnetic radiation source adapted to excite a sample with electromagnetic radiation introduced to the sample at an angle of incidence at or near a critical angle of the sample; a transmitting crystal in communication with the electromagnetic radiation source and the sample, the transmitting crystal having a high refractive index adapted to reflect the electromagnetic radiation internally; a reflector adapted to introduce the electromagnetic radiation to the sample at or near an angle of incidence near the critical angle between the transmitting crystal and sample; and a detector for detecting the electromagnetic radiation from the sample. Also, provided herein are methods, systems, and kits incorporating the peri-critical reflectance spectroscopy apparatus.

Abstract translation: 描述了以样品的临界角取向的光谱装置，其检测样品的光谱特性，其中该装置由电磁辐射源组成，该电磁辐射源适用于以在入射角处或附近的入射角度引入样品的电磁辐射 样品的临界角; 与电磁辐射源和样品通信的透射晶体，透射晶体具有适于在内部反射电磁辐射的高折射率; 反射器，其适于将电磁辐射引入接近接近发射晶体和样品之间的临界角的入射角; 以及用于检测来自样品的电磁辐射的检测器。 此外，本文提供了包含周边反射光谱仪的方法，系统和试剂盒。