公开(公告)号：US20020035454A1

公开(公告)日：2002-03-21

申请号：US09917388

申请日：2001-07-26

Applicant: Raytheon Company

Inventor： Paul M. Ingram JR. ,  Archie H. Muse

IPC: G06F017/10

CPC classification number: G01J5/00 ,  G01J5/007 ,  G01J5/60 ,  G01J2005/0048

Abstract: A method for estimating the error statistic for retrieved temperature and emissivity of a surface material includes determining the second order analytical error propagation from a measured radiance that differs from the true radiance by additive gaussian noise, which is independent in each band. The radiance error is translated into a diagonal covariance matrix and an analytical estimate results in a determination of the standard deviation and bias of surface temperature. Further, the method for estimating the error statistic utilizes Monte Carlo simulation from a sufficiently large ensemble of radiance spectra for the retrieved surface temperature and emissivity. Temperature and emissivity of the surface material were retrieved using ISSTES algorithm.

Abstract translation: 用于估计检索到的温度和表面材料的发射率的误差统计量的方法包括从与每个波段独立的加性高斯噪声不同于真实辐射度的测量辐射度确定二阶分析误差传播。 辐射误差被转换成对角协方差矩阵，并且分析估计导致测定表面温度的标准偏差和偏差。 此外，用于估计误差统计量的方法利用来自足够大的辐射谱集合的蒙特卡罗模拟来获得的表面温度和发射率。 使用ISSTES算法检索表面材料的温度和发射率。